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Growth and characterization of single-crystal lead magnesium niobate–lead titanate via high-pressure vertical Bridgman method

Published online by Cambridge University Press:  03 March 2011

Raji Soundararajan
Affiliation:
Center for Materials Research, School of Mechanical and Materials Engineering, Washington State University, Pullman, Washington 99164
Rabindra Nath Das
Affiliation:
Center for Materials Research, School of Mechanical and Materials Engineering, Washington State University, Pullman, Washington 99164
Russ Tjossem
Affiliation:
Center for Materials Research, School of Mechanical and Materials Engineering, Washington State University, Pullman, Washington 99164
Amit Bandyopadhyay
Affiliation:
Center for Materials Research, School of Mechanical and Materials Engineering, Washington State University, Pullman, Washington 99164
Kelvin G. Lynn
Affiliation:
Center for Materials Research, School of Mechanical and Materials Engineering, Washington State University, Pullman, Washington 99164
Elgin E. Eisser
Affiliation:
II-VI Corporation, Saxonburg, Pennsylvania 16056
Jerry Lazaroff
Affiliation:
II-VI Corporation, Saxonburg, Pennsylvania 16056
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Abstract

We have grown lead magnesium niobate–lead titanate (PMN–PT) single crystals, using the high-pressure vertical Bridgman (HPVB) technique, around the stoichiometric composition of 0.7 PMN–0.3PT [0.7Pb(Mg1/3Nb2/3)O3 + 0.3(PbTiO3)]. The final ingot (about 50-mm diameter, 25-mm long) was machinable using an inner diameter saw. The room-temperature x-ray diffraction on the starting powders and the final single crystal revealed a desirable perovskite structure. The natural growth direction in most of the crystals, as determined using orientation image microscopy, was (110). Examination of the final microstructures and phases/inclusions had been done using optical and infrared microscopy, energy dispersive spectroscopy, and x-ray backscatter techniques. Microstructural characterizations of the final ingots have revealed the presence of pores filled with Mg–Si–O-rich impurity phase, usually found along the cell boundary–like structures, in all the growths. We have measured some piezoelectric properties including d33 (1200 pC/N), k33 (0.85), kt (0.5), and the dielectric constant at the Curie temperature.

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Articles
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1Park, S.E. and Shrout, T.R., Mater. Res. Innovations 1 20 (1997).CrossRefGoogle Scholar
2Park, S.E. and Shrout, T.R., IEEE Trans. Ultrason., Ferroelectr. Freq. Control 44 1140 (1997).CrossRefGoogle Scholar
3Li, T., Scotch, A.M., Chan, H.M., M.P. Harmer et al, J. Am Ceram. Soc. 81 244 (1998).CrossRefGoogle Scholar
4Shrout, T.R., Chang, Z.P., Kim, N. and Markgraf, S., Ferroelectr. Lett. 12 63 (1990).CrossRefGoogle Scholar
5Ye, Z.G. and Dong, M., J. Appl. Phys. 87 2312 (2000).CrossRefGoogle Scholar
6Dong, M. and Ye, Z.G., J. Cryst. Growth 209 81 (2000).Google Scholar
7Harada, K., Shimanuki, S., Kobayashi, T., Saitoh, S. and Yamashita, Y., Key Eng. Mater. 95 157 (1997).Google Scholar
8Harada, K., Shimanuki, S., Kobayashi, T., Saitoh, S. and Yamashita, Y., J. Am. Ceram. Soc. 81 2785 (1998).CrossRefGoogle Scholar
9Shimanuki, S., Saitoh, S. and Yamashita, Y., Jpn. J. Appl. Phys. 37 3382 (1998).CrossRefGoogle Scholar
10Saitoh, S., Takechi, T., Kobayashi, T., Harada, K., Shimanuki, S. and Yamashita, Y., Jpn. J. Appl. Phys. 38 3380 (1999).CrossRefGoogle Scholar
11Electron Backscatter Diffraction in Materials Science, edited by Schwartz, A.J., Kumar, M, and Adams, B.L. (Kluwer Academic/Plenum Publishers).Google Scholar
12Villegas, M., Fernandez, J.F. and Caballero, A.C., J. Mater. Res. 14 (1999).Google Scholar
13Swartz, S.L. and Shrout, T.R., Mater. Res. Bull. 17 1245 (1982).Google Scholar