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Ferroelectric domain structure of epitaxial (Pb,Sr)TiO3 thin films

Published online by Cambridge University Press:  31 January 2011

Yong Kwan Kim ,
Kyeong Seok Lee  and
Sunggi Baik
Yong Kwan Kim
Affiliation:
Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang, 790–784, Korea
Kyeong Seok Lee
Affiliation:
Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang, 790–784, Korea
Sunggi Baik*
Affiliation:
Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang, 790–784, Korea
*
b)Address correspondence to this author.
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Abstract

Epitaxial (Pb1−xSrx)TiO3 (PST, x = 4 0.0–0.24) thin films were grown on MgO(001) single-crystal substrates by pulsed laser deposition. General x-ray diffraction techniques including θ–2θ scan and rocking curve were used to determine lattice constants, degree of c-axis orientation, and crystal quality of the tetragonal thin films. The degree of c-axis orientation in the epitaxial PST films increased as Sr concentration (x) increased, which in turn induces the systematic change in the Curie temperature as well as the transformation strain at and below the Curie temperature. An inverse relation between the c-domain abundances and the transformation strains is established.

Type
Rapid Communications
Information
Journal of Materials Research , Volume 16 , Issue 9 , September 2001 , pp. 2463 - 2466
Copyright
Copyright © Materials Research Society 2001

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