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Epitaxial Growth of Solution-Based Rare-Earth Niobate, RE3NbO7, Films on Biaxially Textured Ni–W Substrates

Published online by Cambridge University Press:  03 March 2011

M. Paranthaman*
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
M.S. Bhuiyan
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831; and University of Houston, Houston, Texas 77204
S. Sathyamurthy
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
H.Y. Zhai
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
A. Goyal
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
K. Salama
Affiliation:
University of Houston, Houston, Texas 77204
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

A new series of rare earth-niobate, RE3NbO7 (RE=Y,Gd,Eu), buffer layers were developed for the growth of superconducting YBa2Cu3O7−δ (YBCO) films on biaxially textured Ni–W (3 at.%) substrates. Using chemical solution deposition, smooth, crack-free, and epitaxial RE3NbO7 (RE = Y,Gd,Eu) films were grown on cube-textured Ni–W substrate. YBCO film with a critical current density of 1.1 × 106 A/cm2 in self-field at 77 K was grown directly on a single Gd3NbO7-buffered Ni–W substrate using pulsed laser deposition.

Type
Rapid Communications
Copyright
Copyright © Materials Research Society 2004

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References

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