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Electron beam effects on Bi–Sr–Ca–Cu–O superconductors

Published online by Cambridge University Press:  31 January 2011

L. Cota-Araiza
Affiliation:
Instituto de Fisica-UNAM, Laboratorio de Ensenada Apdo. Postal 2681, Ensenada, B.C. 22800, México
D.H. Galvan
Affiliation:
Instituto de Fisica-UNAM, Laboratorio de Ensenada Apdo. Postal 2681, Ensenada, B.C. 22800, México
M.H. Farías
Affiliation:
Instituto de Fisica-UNAM, Laboratorio de Ensenada Apdo. Postal 2681, Ensenada, B.C. 22800, México
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Abstract

We present measurements on the superconductor compound Bi–Sr–Ca–Cu–O, obtained using a scanning Auger microscope (SAM), which indicate that this material is extremely unstable under an electron beam with energy of several KeV, Using relatively high current densities for the SAM, it is possible to melt small regions of the material and to form spheres several micrometers in diameter in a few seconds. We characterize the changes in the elemental concentration of the surface of these spheres as a function of time after the beam exposure.

Type
Materials Communications
Copyright
Copyright © Materials Research Society 1991

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References

1.Adem, E., Martínez, L., Rickards, J., Orozco, E., Fuentes-Maya, J., Albarrán, J. L., Mendoza, A., Carrillo, E., Cota, L., Reyes-Gasga, J., Boldú, J. L., Pérez, R., Pérez-Ramírez, J. G., and José-Yacamán, J., J. Mater. Res. 3, 807 (1988).CrossRefGoogle Scholar
2.Matsui, H., Ito, S., Nakagawa, I., Yasuda, K., and Takeda, M., Jpn. J. Appl. Phys. 27, L1281 (1988).CrossRefGoogle Scholar
3.Kato, T., Shiraishi, K., and Kumiya, J., Jpn. J. Appl. Phys. 28, L766 (1989).CrossRefGoogle Scholar
4.Shiraishi, K., Itoh, H., and Kato, T., Jpn. J. Appl. Phys. 29, L441 (1990).CrossRefGoogle Scholar
5.Tokutaka, H., Kishida, S., Nishimori, K., Ishihara, N., Watanabe, Y., Noishiki, Y., and Kawai, T., Jpn. J. Appl. Phys. 28, L222 (1989).CrossRefGoogle Scholar
6.Maeda, H., Tanaka, Y., Fukutomi, M., and Asano, T., Jpn. J. Appl. Phys., Pt. 2 27, L209 (1988).CrossRefGoogle Scholar
7.Reyes-Gasga, J., Pérez, R., Pérez-Ramírez, J. G., Cota-Araiza, L., Fuentes-Maya, J., Garcia, A., and José-Yacamá, M., MRS Fall Meeting, Boston, MA, 1988.Google Scholar
8.Bokhimi, A., Garcia-Ruiz, A., Perez, L., Orozco, E., Asomoza, R., and Asomoza, M., Physica C 159, 654 (1989).Google Scholar
9.Bucket, M. I. and Marks, L. D., Surf. Sci. 232, 353 (1990).CrossRefGoogle Scholar
10.Carrillo, E., Orozco, E., Fuentes, J., Mendoza, A., Acosta, D., and José-Yacamá, M., Mod. Phys. Lett. B2, 841 (1988).CrossRefGoogle Scholar