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Electrical properties of Pt/Bi3.25La0.75Ti3O12/Pt thin film capacitors tailored by cerium doping

Published online by Cambridge University Press:  01 April 2006

S.K. Singh  and
H. Ishiwara
S.K. Singh*
Affiliation:
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Midori-ku, Yokohama 226-8503, Japan
H. Ishiwara
Affiliation:
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Midori-ku, Yokohama 226-8503, Japan
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

Cerium-doped Bi3.25La0.75Ti3O12 (BLT) thin films were fabricated by depositing sol-gel solutions on Pt/Ti/SiO2/Si 〈100〉 substrates. The Ce-doping in BLT up to 6.7% of Ti atoms did not affect the single-phase bismuth-layered structure but small modification was observed in structural orientation, which influenced the microstructure and ferroelectric properties of BLT films. As we did not observe any structural distortion in x-ray diffraction data, it was suggested that doped Ce4+ was converted to Ce3+ during the annealing at 750 °C, and cerium ions might be substituted at Bi-site in BLT films. The small amount of Ce doping (1% of Ti atoms) enhanced the remanent polarization and reduced the coercive field by about 17% in BLT films, and these films showed fatigue-free response up to 1010 switching cycles at 300 kV/cm applied fields. Moderately Ce-doped films (1.7% of Ti atoms) also showed fatigue-free response up to 1010 switching cycles in 200 kV/cm applied field, but the polarization was found to increase with switching cycles when applied field was higher than 200 kV/cm. After Ce doping, the oxygen vacancy concentration may decrease in BLT films, and consequently, one can expect less domain pinning and higher fatigue resistance. Under the high cycling field, the high probability of field-assisted unpinning may be the main cause for the increased polarization.

Keywords

FatigueFerroelectricSolution deposition
Type
Articles
Information
Journal of Materials Research , Volume 21 , Issue 4 , April 2006 , pp. 988 - 994
Copyright
Copyright © Materials Research Society 2006

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