Article contents
Distributions of kinetic pathways in strain relaxation of heteroepitaxial films
Published online by Cambridge University Press: 11 October 2017
Abstract
The kinetic relaxation pathways for strained heteroepitaxial films are mapped using a process simulator that integrates experimental and model descriptions of the energetic and kinetic parameters that define the nucleation, propagation, and interaction of strain relieving dislocations. This paper focuses on Ge x Si1−x /Si(100), but the methodologies described should be extendible to other systems. The kinetic pathways for strain evolution are plotted for film growth as functions of the primary kinetic parameters: growth temperature, growth rate, and initial lattice mismatch, generating relaxation surfaces for parameter pairs. Sensitivity analyses are presented of how deviations from mean parameters disperse the resultant relaxation surfaces. Finally, multi-parameter “fingerprinting” of the dislocation array is shown to illustrate how fundamental kinetic mechanisms—particularly dislocation nucleation mechanisms—define the final dislocation array. The overarching goal is to establish a robust framework for predicting, interrogating, and optimizing strain relaxation pathways and underlying mechanisms, for misfit dislocations in strained heteroepitaxial films.
Keywords
- Type
- Invited Feature Paper
- Information
- Journal of Materials Research , Volume 32 , Issue 21: Focus Issue: Jan van der Merwe: Epitaxy and the Computer Age , 14 November 2017 , pp. 3977 - 3991
- Copyright
- Copyright © Materials Research Society 2017
Footnotes
Contributing Editor: Artur Braun
This paper has been selected as an Invited Feature Paper.
References
REFERENCES
- 1
- Cited by