Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-24T09:28:05.974Z Has data issue: false hasContentIssue false
  • English
  • Français

Determination of the anisotropic optical properties for perfluorinated vanadyl phthalocyanine thin films

Published online by Cambridge University Press:  03 March 2011

O.D. Gordan ,
M. Friedrich ,
W. Michaelis ,
R. Kröger ,
T. Kampen ,
D. Schlettwein  and
D.R.T. Zahn
O.D. Gordan*
Affiliation:
Semiconductor Physics, University of Technology Chemnitz, D-09107 Chemnitz, Germany
M. Friedrich
Affiliation:
Semiconductor Physics, University of Technology Chemnitz, D-09107 Chemnitz, Germany
W. Michaelis
Affiliation:
Physical Chemistry 1, Institute of Pure and Applied Chemistry, Faculty of Science, University of Oldenburg, D-26111 Oldenburg, Germany
R. Kröger
Affiliation:
Institute of Solid State Physics, University of Bremen, D-28334 Bremen, Germany
T. Kampen
Affiliation:
Physics Institute, University of Technology Chemnitz, D-09107 Chemnitz, Germany
D. Schlettwein
Affiliation:
Physical Chemistry 1, Institute of Pure and Applied Chemistry, Faculty of Science, University of Oldenburg, D-26111 Oldenburg, Germany
D.R.T. Zahn
Affiliation:
Semiconductor Physics, University of Technology Chemnitz, D-09107 Chemnitz, Germany
*
a) Address all correspondence to this author. e-mail: [email protected]
Get access

Abstract

Thin films of perfluorinated vanadyl phthalocyanine F16PcVO were prepared by physical vapor deposition in high vacuum on KBr and fused silica substrates. The absorption spectra in the visible region show that the films on different substrates have different structure. The optical constants for F16PcVO films were obtained in the spectral range of 0.7–4.5 eV from the simulation of ellipsometry spectra with an anisotropic uniaxial model. From the difference between the in-plane and out-of-plane components of the extinction coefficient the average tilt angle of the F16PcVO molecular planes with respect to the substrate plane was found to be 56° for fused silica substrates and between 0° and 3° for KBr substrates.

Keywords

OrganicThin filmOptical properties
Type
Articles—Organic Electronics Special Section
Information
Journal of Materials Research , Volume 19 , Issue 7 , July 2004 , pp. 2008 - 2013
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.McKeown, N.B.: Phthalocyanine Materials (Cambrige University Press, Cambridge, U.K., 1998).Google Scholar
2.Forrest, S.R.: Chem. Rev. 97, 1793 (1997).CrossRefGoogle Scholar
3.Phthalocyanines Properties and Applications, edited by Leznoff, C.C. and Lever, A.B.P. (VCH, New York, 1996), Vol. 4.Google Scholar
4.Chadwick, A.V., Dunning, P.B.M. and Wright, J.D.:Mol. Cryst. Liq. Cryst. 134, 137 (1986).CrossRefGoogle Scholar
5.Wang, D.X., Tanaka, Y., Iizuka, M., Kuniyoshi, S., Kudo, S. and Tanaka, K.: Jpn. J. Appl. Phys. 38, 256 (1999).CrossRefGoogle Scholar
6.Gu, G., Khalfin, V. and Forrest, S.R.: Appl. Phys. Lett. 73, 2399 (1999).CrossRefGoogle Scholar
7.van Slyke, S.A., Chen, C.H. and Tang, C.W.: Appl. Phys. Lett. 69, 2160 (1996).CrossRefGoogle Scholar
8.Yonehara, H. and Pac, C.: Thin Solid Films 278, 108 (1996).CrossRefGoogle Scholar
9.Bao, Z.: Adv. Mater. 12, 227 (2000).3.0.CO;2-U>CrossRefGoogle Scholar
10.Hohnholz, D., Steinbrecher, S. and Hanack, M.: J. Mol. Struct. 521, 231 (2000).CrossRefGoogle Scholar
11.Chadwick, A.V., Dunning, P.B.M. and Wright, J.D.: Mol. Cryst. Liq. Cryst. 134, 137 (1986).CrossRefGoogle Scholar
12.Yanagi, H. and Manivannan, A.: Thin Solid Films 393, 28 (2001).CrossRefGoogle Scholar
13.Schlettwein, D., Tada, H. and Mashiko, S.: Langmuir 16, 2872 (2000).CrossRefGoogle Scholar
14.Schlettwein, D., Hesse, K., Tada, H., Mashiko, S., Storm, U. and Binder, J.: J. Chem. Mater. 12, 989 (2000).CrossRefGoogle Scholar
15.Schubert, M.: Polarisation dependent optical parameters of an arbitrarily anisotropic homogeneous layered system. Phys. Rev. B 53, 4265 (1996).CrossRefGoogle Scholar
16.Berreman, D.W.: J. Opt. Soc. Am. 62, 502 (1972).CrossRefGoogle Scholar
17.Gordan, O.D., Friedrich, M. and Zahn, D.R.T.Determination of the Anisotropic Dielectric Function for Metal Free Phthalocyanine Thin Films. Thin Solid Films, 455, 551 (2004).CrossRefGoogle Scholar
18.Woollam, J.A.: Guide to Use WVASE32 . J.A. Woollam Co., Inc.Google Scholar
19.Azzam, R.M.A. and Bashara, N.M.: Ellipsometry and Polarized Light (Elsevier, Amsterdam, The Netherlands, 1992).Google Scholar
20.Mcgahn, W.A., Johs, B. and Wollam, J.A.: Thin Solid Films 234, 443 (1993).CrossRefGoogle Scholar