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Combinatorial investigation of the mechanical properties of aluminum-silicon thin film nanocomposites

Published online by Cambridge University Press:  03 March 2011

C.H. Olk ,
M. Lukitsch  and
D.B. Haddad
C.H. Olk*
Affiliation:
Materials and Processes Laboratory, General Motors Research and Development Center, Warren, Michigan 48090
M. Lukitsch
Affiliation:
Materials and Processes Laboratory, General Motors Research and Development Center, Warren, Michigan 48090
D.B. Haddad
Affiliation:
School of Materials Engineering, Purdue University, West Lafayette, Indiana 47907
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

We have undertaken the exploration of AlxSi1−x material systems to discover new alloys with enhanced mechanical properties. Combinatorial methods were used to systematically control thin film microstructure through variations in composition and growth temperature. Discrete libraries of compositionally graded films have been sputter deposited onto silicon substrates to produce two structural phase regions: amorphous Al–Si and amorphous Si plus crystalline Al. The mechanical properties of the thin films were determined through indentation experiments by analyzing the load–displacement traces based on the Oliver–Pharr method. X-ray diffraction was used to investigate the microstructures and determine the crystallite sizes. In samples with an Al concentration near 55 at.%, the data show that decreasing the Al crystallite size by nearly one half increases the nanocomposite hardness by nearly a factor of two.

Keywords

Combinatorial synthesisElastic propertiesNanoscale
Type
Articles
Information
Journal of Materials Research , Volume 22 , Issue 4 , April 2007 , pp. 1029 - 1036
Copyright
Copyright © Materials Research Society 2007

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References

REFERENCES

1Cibula, J.: The mechanism of grain refinement of sand castings in aluminum alloys. J. Inst. Met. 76, 321 (1949–1950).Google Scholar
2Rao, A.K. Prasada, Das, K., Murty, B.S., and Chakraborty, M.: Effect of grain refinement on wear properties of Al and Al–7Si alloy. Wear 257, 148 (2004).Google Scholar
3McCartney, D.G.: Grain refining of aluminum and its alloys using inoculants. Int. Mater. Rev. 34, 247 (1989).CrossRefGoogle Scholar
4Subramanian, C.: Some considerations towards the design of a wear resistant aluminum alloy. Wear 155, 193 (1992).CrossRefGoogle Scholar
5Casellas, D., Beltran, A., Prado, J.M., Larson, A., and Romero, A.: Microstructural effects on the dry wear resistance of powder metallurgy Al–Si alloys. Wear 257, 730 (2004).CrossRefGoogle Scholar
6Konno, T.J. and Sinclair, R.: In situ HREM of crystallization reactions. Mater. Chem. Phys. 35, 99 (1993).CrossRefGoogle Scholar
7Cremer, R. and Richter, S.: Rapid chemical and structural characterization of metastable thin-film libraries by a combination of electron probe microanalysis and scanning x-ray diffract. Surf. Interf. Anal. 34, 686 (2002).CrossRefGoogle Scholar
8Bellamy, F.: High throughput synthesis (combinatorial chemistry) in the pharmaceutical industry. Actual Chim. 9, 4 (2000).Google Scholar
9Xiang, X.D., Sun, X., Briceno, G., Lou, Y., Wang, K., Chang, H., Wallace-Freedman, W.G., Chen, S., and Schultz, P.: A combinatorial approach to materials discovery. Science 268, 1738 (1995).CrossRefGoogle ScholarPubMed
10Schlogl, R.: Combinatorial electrochemical synthesis and screening of Pt–WO3 catalysts for electro-oxidation of methanol. Angew. Chem. 37, 2333 (1998).Google Scholar
11Wang, J., Yoo, Y., Gao, C., Takeuchi, I., Sun, X., Chang, H., Xiang, X.D., and Schultz, P.: Identification of a blue photoluminescent composite material from a combinatorial library. Science 279, 1712 (1998).CrossRefGoogle ScholarPubMed
12Chang, H., Gao, C., Takeuchi, I., Yoo, Y., Wang, J., Schultz, P., Xiang, X.D., Sharma, R.P., Downes, M., and Venkatesan, T.: Combinatorial synthesis and high throughput evaluation of ferroelectric/dielectric thin-film libraries for microwave applications. Appl. Phys. Lett. 72, 2185 (1998).CrossRefGoogle Scholar
13Evans, J.R.G., Edirisinghe, M.J., Coveney, P.V., and Eames, J.: Combinatorial searches of inorganic materials using the ink-jet printer: Science, philosophy and technology. J. Eur. Cer. Soc. 21, 2291 (2001).CrossRefGoogle Scholar
14Olk, C.H. and Haddad, D.B.: Characterization and control of microstructure in combinatorially prepared aluminum-silicon thin film nanocomposites. J. Mater. Res. 21, 1221 (2006).CrossRefGoogle Scholar
15Olk, C.H., Tibbetts, G.G., Simon, D., and Moleski, J.J.: Combinatorial preparation and infrared screening of hydrogen sorbing metal alloys. J. Appl. Phys. 94, 720 (2003).CrossRefGoogle Scholar
16Hanak, J.: Multiple-sample concept in materials research: Synthesis, compositional analysis and testing of entire multicomponent systems. J. Mater. Sci. 5, 964 (1970).CrossRefGoogle Scholar
17Hanak, J.: A quantum leap in the development of new materials and devices. Appl. Surf. Sci. 223, 1 (2004).CrossRefGoogle Scholar
18Briceño, G., Chang, H., Sun, X., Schultz, P.G., and Xiang, X-D.: Class of cobalt oxide magnetoresistance materials discovered with combinatorial synthesis. Science 270, 273 (1995).CrossRefGoogle Scholar
19Xiang, X-D.: High throughput synthesis and screening for functional materials. Appl. Surf. Sci. 223, 54 (2004).CrossRefGoogle Scholar
20Zhao, J-C.: A combinatorial approach for efficient mapping of phase diagrams and properties. J. Mater. Res. 16, 1565 (2001).CrossRefGoogle Scholar
21Koinuma, H. and Takeuchi, I.: Combinatorial solid-state chemistry of inorganic materials. Nat. Mater. 3, 429 (2004).CrossRefGoogle ScholarPubMed
22Combinatorial Materials Syntheses, edited by Takeuchi, I. and Xiang, X-D. (Marcel Dekker, New York, 2003).Google Scholar
23Oliver, W.C. and Pharr, G.M.: An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments. J. Mater. Res. 7, 1564 (1992).CrossRefGoogle Scholar
24Olk, C.H. and Haddad, D.: Modifying La–Mg–Ni alloy thin film microstructure using combinatorial methods. J. Alloys Compd. 417, 235 (2006).CrossRefGoogle Scholar
25Koster, U. and Weiss, P.: Crystallization and decomposition of amorphous silicon-aluminum films. J. Non-Cryst. Solids 17, 359 (1975).CrossRefGoogle Scholar
26Dimova-Malinovska, D., Grigorov, V., Nikolaeva-Dimitrova, M., Angelov, O., and Peev, N.: Investigation of structural properties of poly-Si thin films obtained by Al induced crystallization in different atmospheres. Thin Solid Films 501, 358 (2006).CrossRefGoogle Scholar
27Klein, J., Schneider, J., Muske, M., Gail, S., and Fuhs, W.: Aluminum-induced crystallization of amorphous silicon: Influence of the aluminum layer on the process. Thin Solid Films 451–452, 481 (2004).CrossRefGoogle Scholar
28Naka, M., Shibayanagi, T., Maeda, M., Zhao, S., and Mori, H.: Formation and physical properties of Al base alloys by sputtering. Vacuum 59, 252 (2000).CrossRefGoogle Scholar
29Zalar, A., Wang, J.Y., Zhao, Y.H., Mittenmeijer, E.J., and Panjan, P.: AES depth profiling of thermally treated Al/Si thin-film structures. Vacuum 71, 11 (2003).CrossRefGoogle Scholar
30Kim, Y. and Lieber, C.M.: Machining oxide thin films with an atomic force and object formation on the nanometer scale. Science 257, 375 (1992).CrossRefGoogle ScholarPubMed
31Winkler, R.G., Spatz, J.P., Sheiko, S., Moller, M., Reineker, P.R., and Marti, O.: Forces affecting the substrate in resonant tapping force microscopy. Phys. Rev. B 54, 8908 (1996).CrossRefGoogle Scholar
32Han, S.M., Saha, R., and Nix, W.D.: Determining hardness of thin films in elastically mismatched film-on-substrate systems using nanoindentation. Acta Mater. 54,1571 (2006).CrossRefGoogle Scholar
33Khayyat, M.M., Banini, G.K., Hasko, G., and Chudhri, M.M.: Raman microscopy investigations of structural phase transformations in crystalline and amorphous silicon due to indentation with a Vickers diamond at room temperature and at 77 K. J. Phys. D: Appl. Phys. 36, 1300 (2003).CrossRefGoogle Scholar
34Hall, E.O.: The deformation and ageing of mild steel: III. Discussion of results. Proc. Phys. Soc., London B. 64, 747 (1951).CrossRefGoogle Scholar
35Petch, N.J.: The cleavage strength of polycrystals. J. Iron Steel Inst. 173, 25 (1953).Google Scholar
36Jen, S.U. and Wu, T.C.: Young’s modulus and hardness of Pd thin films. Thin Solid Films 492, 166 (2005).CrossRefGoogle Scholar
37Lepienski, C.M., Pharr, G.M., Park, Y.J., Watkins, T.R., Misra, A., and Zhang, X.: Factors limiting the measurement of residual stresses in thin films by nanoindentation. Thin Solid Films 447–448, 251 (2004).CrossRefGoogle Scholar
38Lakhtakia, A. and Messier, R.: Sculptured Thin Films (SPIE Press, Bellingham, WA, 2004).CrossRefGoogle Scholar