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C24Cs samples containing oriented N2 molecules

Published online by Cambridge University Press:  31 January 2011

Y. Finkelstein ,
R. Moreh ,
D. Nemirovsky ,
O. Shahal ,
F. Beguin  and
L. Duclaux
Y. Finkelstein
Affiliation:
Physics Department, Ben-Gurion University, Beer-Sheva 84105, Israel
R. Moreh
Affiliation:
Physics Department, Ben-Gurion University, Beer-Sheva 84105, Israel
D. Nemirovsky
Affiliation:
Physics Department, Ben-Gurion University, Beer-Sheva 84105, Israel
O. Shahal
Affiliation:
Physics Department, Nuclear Research Center-Negev, Beer-Sheva 84190 Israel
F. Beguin
Affiliation:
Centre de Recherche sur la Matiere Divisee, CNRS-Université, 1B, F-45071 Orléans Cedex 02, France
L. Duclaux
Affiliation:
Centre de Recherche sur la Matiere Divisee, CNRS-Université, 1B, F-45071 Orléans Cedex 02, France
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Abstract

The adsorption of N2 molecules inside C24Cs has been studied in detail as a function of temperature and pressure using n-diffraction and nuclear resonance photon scattering (NRPS). Large differences were observed between samples derived from highly oriented pyrolytic graphite and those prepared from graphite powder. The tilt angle of the N2 molecular axis was determined by using NRPS and found to lay nearly parallel to the graphite planes. The amount of adsorbed N2 increased with decreasing temperatures, reaching saturation composition C24Cs(N2)1.5 at approximately 100 K with an initial N2 pressure of 2 bar. At higher pressure, 9 bar, two new phases were formed: a second stage C32Cs(N2)2.1 and a first stage C16Cs(N2)1.8 at T < 170 K and are discussed in detail.

Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 7 , July 1999 , pp. 3130 - 3137
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1.Watanabe, K., Kondow, T., Soma, S., and Tamura, K., Proc. R. Soc. Lond 333, 51 (1973).Google Scholar
2.Beguin, F., Setton, R., and Facchini, L., Synth. Metals 7, 263 (1983).Google Scholar
3.Akuzawa, N., Kondow, S., Kaburagei, Y., Hishiyama, Y., and Takahashi, Y., Carbon, 31, 963 (1993).CrossRefGoogle Scholar
4.Moreh, R., Pinto, H., Finkelstein, Y., Volterra, V., Birenbaum, Y., Beguin, F., Phys. Rev. B, 52, 5330 (1995).CrossRefGoogle Scholar
5.Moreh, R., Melloul, S., and Zabel, H., Phys. Rev. B, 71, 1075 (1993).Google Scholar
6.Pilliere, H., Goldmann, M., and Beguin, F., J. Mater. Res. 8, 2288 (1993).CrossRefGoogle Scholar
7.Moreh, R., Shahal, O., and Volterra, V., Nucl. Phys. A262, 221 (1976).CrossRefGoogle Scholar
8.Drits, V.A. and Tchoubar, C., X-ray Diffraction by Disordered Lamellar Structures (Springer–Verlag, Berlin, Germany, 1990) pp. 71,77.Google Scholar
9.Duclaux, L., Rannou, I., Beguin, F., and Lelaurain, M., J. Mater. Res. 3, 608 (1996).CrossRefGoogle Scholar
10.Hewat, A.W., Acta Crystallogr. A35, 248 (1979).CrossRefGoogle Scholar
11.Sasa, Y., Uda, M., J. Solid State Chemistry 18, 63 (1976).CrossRefGoogle Scholar
12.Cox, D.E., Powder Diffraction Handbook on Synchrotron Radiation; Vol. 3 (G. Brown and D.E. Moncton Elsevier Science Publishers B.V., Holland, 1991) pp. 155–200.Google Scholar
13.Duclaux, L., Beguin, F., Andersen, K., and Ouladdiaf, B., Mol. Cry. Liq. Cry. 310, 99 (1998).Google Scholar
14.Skaked, H., Moreh, R., Pinto, H., and Melamud, M., Physica B, 233, 66 (1997).CrossRefGoogle Scholar
15.Goldman, M., Pillière, H., and Beguin, F., Synthetic Metals, 34, 59 (1989).CrossRefGoogle Scholar