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Transmission electron microscopy study of YNi2B2C thin film growth on MgO(001)

Published online by Cambridge University Press:  03 March 2011

G.H. Cao ,
P. Simon  and
W. Skrotzki
G.H. Cao*
Affiliation:
Institute of Structural Physics, Dresden University of Technology, D-01062 Dresden, Germany
P. Simon
Affiliation:
Institute of Structural Physics, Dresden University of Technology, D-01062 Dresden, Germany
W. Skrotzki
Affiliation:
Institute of Structural Physics, Dresden University of Technology, D-01062 Dresden, Germany
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

A YNi2B2C thin film deposited on MgO(001) substrate by pulsed laser deposition has been investigated by transmission electron microscopy (TEM). Cross-sectional TEM analyses show that the YNi2B2C film grows in the [001] direction. Y2O3 exists not only as an interlayer at the interface of the YNi2B2C thin film and the MgO substrate but occasionally also in the YNi2B2C thin film near the substrate. The orientation relationships between the YNi2B2C thin film, Y2O3 interlayer, and MgO substrate are determined from electron-diffraction patterns to be MgO(001)[100] ‖ Y2O3(001)[100], YNi2B2C(001)[110] ‖ Y2O3(001)[100] ‖ Y2O3(001)[100, and YNi2B2C(001)[100] ‖ Y2O3(001)[100 1.5‖ Y2O3(001)[100] ‖ Y2O3(001)[100 (the numeral above the “parallel” symbol represents the misorientation (in degrees) between the [100] ‖ Y2O3(001)[100 directions).

Keywords

FilmMicrostructureTransmission electron microscopy (TEM)
Type
Articles
Information
Journal of Materials Research , Volume 19 , Issue 5 , May 2004 , pp. 1413 - 1416
Copyright
Copyright © Materials Research Society 2004

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