Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-28T14:02:31.955Z Has data issue: false hasContentIssue false

A simple method for evaluating elastic modulus of thin films by nanoindentation

Published online by Cambridge University Press:  31 January 2011

Zhongxin Wei
Affiliation:
Department of Civil and Environmental Engineering, Louisiana State University, Baton Rouge, Louisiana 70803
Guoping Zhang*
Affiliation:
Department of Civil and Environmental Engineering, Louisiana State University, Baton Rouge, Louisiana 70803
Hao Chen
Affiliation:
Department of Civil and Environmental Engineering, Louisiana State University, Baton Rouge, Louisiana 70803
Jian Luo
Affiliation:
School of Materials Science and Engineering, Clemson University, Clemson, South Carolina 29634
Ranran Liu
Affiliation:
Department of Civil and Environmental Engineering, Louisiana State University, Baton Rouge, Louisiana 70803
Shengmin Guo
Affiliation:
Department of Mechanical Engineering, Louisiana State University, Baton Rouge, Louisiana 70803
*
a) Address all correspondence to this author. e-mails: [email protected];[email protected]
Get access

Abstract

A simple empirical method that extracts the elastic moduli of both thin films and the underlying substrates is proposed and validated by both new nanoindentation experiments and published data. Deconvolution of thin film’s elastic properties from the substrate is achieved by statistical estimation, where a simple function relating the elastic moduli of the thin film and substrate to the film-substrate composite modulus is used to fit the experimental data plotted against the logarithmic indentation depth normalized by film thickness. Experimental data from a wide range of soft and hard films on substrate were used to demonstrate the deconvolution and validate the method. The estimated elastic moduli of thin films and substrates agree well with their corresponding standard values or values obtained by other methods. The advantages of this method are discussed, and recommendations are made on how to design experiments to obtain reliable data for this method.

Type
Articles
Copyright
Copyright © Materials Research Society 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Tabata, O., Kawahata, K., Sugiyama, S., and Igarashi, I.: Mechanical property measurement of thin films using load-deflection of composite rectangular membranes. Sens. Actuators 20, 135 (1989).CrossRefGoogle Scholar
2.Baker, S.P. and Nix, W.D.: Mechanical properties of composition-ally modulated Au-Ni thin films: Nanoindentation and microcantilever deflection experiments., J. Mater. Res. 9, 3131 (1994).Google Scholar
3.Luo, J.K., Flewitt, A.J., Spearing, S.M., Fleck, N.A., and Milne, W.I.: Young's modulus of electroplated Ni thin film for MEMS applications. Mater. Lett. 58, 2306 (2004).Google Scholar
4.Read, D.T.: Young's modulus of thin films by speckle interferometry. Meas. Sci. Technol. 9, 676 (1998).Google Scholar
5.Prasad, M., Kopycinska, M., Rabe, U., and Arnold, W.: Measurement of Young's modulus of clay minerals using atomic force acoustic microscopy. Geophys. Res. Lett. 29, 13 (2002).CrossRefGoogle Scholar
6.Pietrement, O. and Troyon, M.: Quantitative elastic modulus measurement by magnetic force modulation microscopy. Tribol. Lett. 9, 77 (2000).Google Scholar
7.Stafford, C.M., Harrison, C., Beers, K.L., Karim, A., Amis, E.J., Vanlandingham, M.R., Kim, H-C., Volksen, W., Miller, R.D., and Simony, E.E.: A buckling-based metrology for measuring the elastic moduli of polymeric thin films. Nat. Mater. 3, 545 (2004).Google Scholar
8.Oliver, W.C. and Pharr, G.M.: An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments., J. Mater. Res. 7, 1564 (1992).CrossRefGoogle Scholar
9.Mencik, J., Munz, D., Quandt, E., Weppelmann, E.R., and Swain, M.V.: Determination of elastic modulus of thin layers using nanoindentation. J. Mater. Res. 12, 2475 (1997).CrossRefGoogle Scholar
10.Jung, Y-G., Lawn, B.R., Martyniuk, M., Huang, H., and Hu, X.Z.: Evaluation of elastic modulus and hardness of thin films by nanoindentation. J. Mater. Res. 19, 3076 (2004).CrossRefGoogle Scholar
11.Li, X. and Bhushan, B.: A review of nanoindentation continuous stiffness measurement technique and its applications. Mater. Charact. 48, 11 (2002).CrossRefGoogle Scholar
12.Li, X., Gao, H., Scrivens, W.A., Fei, D., Thakur, V., Sutton, M.A., Reynolds, A.P., and Myrick, M.L.: Structural and mechanical characterization of nanoclay-reinforced agarose nanocomposites. Nanotechnology 16, 2020 (2005).CrossRefGoogle ScholarPubMed
13.Schneider, D. and Schultrich, B.: Elastic modulus: A suitable quantity for characterization of thin films. Surf. Coat. Technol. 98, 962 (1998).Google Scholar
14.Liang, C. and Prorok, B.C.: Measuring the thin film elastic modulus with a magnetostrictive sensor., J. Micromech. Microeng. 17, 709 (2007).CrossRefGoogle Scholar
15.Bamber, M.J., Cooke, K.E., Mann, A.B., and Derby, B.: Accurate determination of Young's modulus and Poisson's ratio of thin films by a combination of acoustic microscopy and nanoindentation. Thin Solid Films 398–399, 299 (2001).CrossRefGoogle Scholar
16.Jennett, N.M., Aldrich-Smith, G., and Maxwell, A.S.: Validated measurement of Young's modulus, Poisson ration, and thickness for thin coatings by combining instrumented nanoin-dentation and acoustical measurements. J. Mater. Res. 19, 143 (2004).Google Scholar
17.Oliver, W.C. and Pharr, G.M.: Measurement of hardness and elastic modulus by instrumented indentation: Advances in understanding and refinements to methodology. J. Mater. Res. 19, 3 (2004).CrossRefGoogle Scholar
18.Sneddon, I.N.: The relation between load and penetration in the axisymmetric Boussinesq problem for a punch of arbitrary profile. Int. J. Eng. Sci. 3, 47 (1965).Google Scholar
19.Doerner, M.F. and Nix, W.D.: A method for interpreting the data from depth-sensing indentation instruments. J. Mater. Res. 1, 601 (1986).Google Scholar
20.Chen, K-S., Chen, T-C., and Ou, K-S.: Development of semi-empirical formulation for extracting materials properties from nanoindentation measurements: Residual stresses, substrate effect, and creep. Thin Solid Films 516, 1931 (2008).Google Scholar
21.King, R.B.: Elastic analysis of some punch problems for a layered medium. Int. J. Solids Struct. 23, 1657 (1987).CrossRefGoogle Scholar
22.Tuck, J.R., Korsunsky, A.M., Bhat, D.G., and Bull, S.J.: Indentation hardness evaluation of cathodic arc deposited thin hard coatings. Surf. Coat. Technol. 139, 63 (2001).CrossRefGoogle Scholar
23.Joslin, D.L. and Oliver, W.C.: A new method for analyzing data from continuous depth-sensing microindentation tests. J. Mater. Res. 5, 123 (1990).Google Scholar
24.Lilleodden, E.T. and Nix, W.D.: Microstructural length-scale effects in the nanoindentation behavior of thin gold films. Acta Mater. 54, 1583 (2006).CrossRefGoogle Scholar
25.Lian, J., Garay, J.E., and Wang, J.: Grain size and grain boundary effects on the mechanical behavior of fully stabilized zirconia investigated by nanoindentation. Scr. Mater. 56, 1095 (2007).CrossRefGoogle Scholar
26.Nix, W.D. and Gao, H.J.: Indentation size effects in crystalline materials: A law for strain gradient plasticity. J. Mech. Phys. Solids 46, 411 (1998).CrossRefGoogle Scholar
27.Lou, J., Shrotriya, P., Buchheit, T., Yang, D., and Soboyejo, W.O.: A nano-indentation study on the plasticity length scale effects in LiGa Ni MEMS structures. J. Mater. Sci. 38, 4137 (2003).Google Scholar
28.Wu, T.W., Moshref, M., and Alexopoulos, P.S.: The effect of the interfacial strength on the mechanical properties of aluminum films. Thin Solid Films 187, 295 (1990).Google Scholar
29.Sakai, M. and Nakano, Y.: Instrumented pyramidal and spherical indentation of polycrystalline graphite. J. Mater. Res. 19, 228 (2004).Google Scholar
30.Bei, H., George, E.P., Hay, J.L., and Pharr, G.M.: Influence of indenter tip geometry on elastic deformation during nanoindentation. Phys. Rev. Lett. 95, 045501 (2005).Google Scholar
31.Saha, R. and Nix, W.D.: Effects of the substrate on the determination of thin film mechanical properties by nanoindentation. Acta Mater. 50, 23 (2002).Google Scholar
32.Gao, H., Chiu, C-H., and Lee, J.: Elastic contact versus indentation modelling of multi-layered materials. Int. J. Solids Struct. 29, 2471 (1992).Google Scholar
33.Fischer-Cripps, A.C.: Nanoindentation, 2nd ed. (Springer-Verlag, New York, 2002).Google Scholar
34.Jen, S.U. and Wu, T.C.: Young's modulus and hardness of Pd thin films. Thin Solid Films 492, 166 (2005).CrossRefGoogle Scholar
35.Hu, X.Z. and Lawn, B.R.: A simple indentation stress-strain relation for contacts with spheres on bilayer structures. Thin Solid Films 322, 225 (1998).CrossRefGoogle Scholar
36.Korsunsky, A.M., McGurk, M.R., Bull, S.J., and Page, T.F.: On the hardness of coated systems. Surf. Coat. Technol. 99, 171 (1998).CrossRefGoogle Scholar
37.Arcot, P.K. and Luo, J.: Solution-based synthesis of oxide thin films via a layer-by-layer deposition method: Feasibility and a phenomenological film growth model. Surf. Coat. Technol. 202, 2690 (2008).Google Scholar
38.Chen, H., Zhang, G., Richardson, K., and Luo, J.: Synthesis of nanostructured nanoclay-zirconia multilayers: A feasibility study. J. Nanomaterials 2008, 749508 (2008).Google Scholar
39.ISO (International Organization for Standardization): Metallic Materials—Instrumented Indentation Test for Hardness and Materials Parameters ISO 14577 (2002).Google Scholar
40.Ruff, A.W.: Nanoindentation and instrumented scratching measurements on hard coatings, in Effect of Surface Coatings and Treatments on Wear, edited by Bahadur, S. (American Society for Testing and Materials, 1996), pp. 124, 146.Google Scholar
41.Bhushan, B. and Li, X.: Nanomechanical characterization of solid surfaces and thin films. Int. Mater. Rev. 48, 125 (2003).CrossRefGoogle Scholar