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Photoelectrochemical properties of N-doped self-organized titania nanotube layers with different thicknesses

Published online by Cambridge University Press:  03 March 2011

J.M. Macak ,
A. Ghicov ,
R. Hahn ,
H. Tsuchiya  and
P. Schmuki
J.M. Macak
Affiliation:
Department of Materials Science, WW4-LKO, University of Erlangen-Nuremberg, D-91058 Erlangen, Germany
A. Ghicov
Affiliation:
Department of Materials Science, WW4-LKO, University of Erlangen-Nuremberg, D-91058 Erlangen, Germany
R. Hahn
Affiliation:
Department of Materials Science, WW4-LKO, University of Erlangen-Nuremberg, D-91058 Erlangen, Germany
H. Tsuchiya
Affiliation:
Department of Materials Science, WW4-LKO, University of Erlangen-Nuremberg, D-91058 Erlangen, Germany
P. Schmuki*
Affiliation:
Department of Materials Science, WW4-LKO, University of Erlangen-Nuremberg, D-91058 Erlangen, Germany
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

The present work reports nitrogen doping of self-organized TiO2 nanotubular layers. Different thicknesses of the nanotubular layer architecture were formed by electrochemical anodization of Ti in different fluoride-containing electrolytes; tube lengths were 500 nm, 2.5 μm, and 6.1 μm. As-formed nanotube layers were annealed to an anatase structure and treated in ammonia environment at 550 °C to achieve nitrogen doping. The crystal structure, morphology, composition and photoresponse of the N-doped were characterized by scanning electron microscopy, x-ray diffraction, x-ray photoelectron spectroscopy, and photoelectrochemical measurements. Results clearly show that successful N-doping of the TiO2 nanotubular layers can be achieved upon ammonia treatment. The magnitude of the photoresponse in ultraviolet and visible light is strongly dependent on the thicknesses of the layers. This effect is ascribed to recombination effects along the tube length.

Keywords

Electron-phonon interactionsNanostructureSelf-assembly
Type
Articles
Information
Journal of Materials Research , Volume 21 , Issue 11 , November 2006 , pp. 2824 - 2828
Copyright
Copyright © Materials Research Society 2006

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