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Nanostructured Nd0.45Sr0.55MnO3 films grown on SrTiO3(110)

Published online by Cambridge University Press:  17 January 2013

Yunlong Tang ,
Yinlian Zhu ,
Yuqin Zhang ,
Zhidong Zhang  and
Xiuliang Ma
Yunlong Tang
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China
Yinlian Zhu*
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China
Yuqin Zhang
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China
Zhidong Zhang
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China
Xiuliang Ma
Affiliation:
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

To explore the relationships between microstructure and growth direction, metallic A-type antiferromagnetic and anisotropic magnetoresistant Nd0.45Sr0.55MnO3 (NSMO) thin films were grown on SrTiO3(110) by pulsed laser deposition method and characterized by (scanning) transmission electron microscopy. The interface between NSMO and SrTiO3 (110) is flat and sharp. The NSMO thin films exhibit a two-layered structure: a continuous perovskite layer epitaxially grown on the substrate followed by an epitaxially grown columnar nanostructure [Fig. 1(a)]. High-density stacking faults were found in the nanostructured layer with an in-plane translational displacement of 1/2a<111>, accompanied by 1/2a[001] partial dislocations or (110) antiphase boundaries (APBs). These stacking faults terminate either at pores or in the grain matrix to eliminate (1$\bar 1$0) APBs. The formation mechanisms of the nanostructured NSMO films and the relevant stacking faults are discussed from the viewpoint of both film growth and specific substrate direction.

Keywords

transmission electron microscopyfilmmicrostructure
Type
Articles
Information
Journal of Materials Research , Volume 28 , Issue 13: FOCUS ISSUE: Frontiers in Thin-Film Epitaxy and Nanostructured Materials , 14 July 2013 , pp. 1692 - 1698
Copyright
Copyright © Materials Research Society 2013 

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References

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