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Nanoindentation and contact-mode imaging at high temperatures

Published online by Cambridge University Press:  01 March 2006

Christopher A. Schuh ,
Corinne E. Packard  and
Alan C. Lund
Christopher A. Schuh*
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
Corinne E. Packard
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
Alan C. Lund
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

Technical issues surrounding the use of nanoindentation at elevated temperatures are discussed, including heat management, thermal equilibration, instrumental drift, and temperature-induced changes to the shape and properties of the indenter tip. After characterizing and managing these complexities, quantitative mechanical property measurements are performed on a specimen of standard fused silica at temperatures up to 405 °C. The extracted values of hardness and Young's modulus are validated against independent experimental data from conventional mechanical tests, and accuracy comparable to that obtained in standard room-temperature nanoindentation is demonstrated. In situ contact-mode images of the surface at temperature are also presented.

Keywords

HardnessNanostructureThermal stresses
Type
Articles
Information
Journal of Materials Research , Volume 21 , Issue 3 , March 2006 , pp. 725 - 736
Copyright
Copyright © Materials Research Society 2006

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