Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Dewen Tian
Hongtao Chen
and
Chunqing Wang
2005.
Effect of thermal aging on microstructure, shear and mechanical shock failures for solder ball bonding joint.
p.
1.
Erinç, M.
Schreurs, P. J. G.
Zhang, G. Q.
and
Geers, M. G. D.
2005.
Microstructural damage analysis of SnAgCu solder joints and an assessment on indentation procedures.
Journal of Materials Science: Materials in Electronics,
Vol. 16,
Issue. 10,
p.
693.
Huang, M. L.
and
Wang, L.
2005.
Effects of Cu, Bi, and In on microstructure and tensile properties of Sn-Ag-X(Cu, Bi, In) solders.
Metallurgical and Materials Transactions A,
Vol. 36,
Issue. 6,
p.
1439.
Erinc, M.
Schreurs, P.J.G.
Zhang, G.Q.
and
Geers, M.G.D.
2005.
Reliability of SnAgCu solder balls in packaging.
p.
656.
Gong, Jicheng
Liu, Changqing
Conway, Paul P.
and
Silberschmidt, Vadim V.
2006.
Modelling of Ag3Sn coarsening and its effect on creep of Sn–Ag eutectics.
Materials Science and Engineering: A,
Vol. 427,
Issue. 1-2,
p.
60.
Williamson, D M
Field, J E
Palmer, S J P
and
Siviour, C R
2007.
Rate dependent strengths of some solder joints.
Journal of Physics D: Applied Physics,
Vol. 40,
Issue. 15,
p.
4691.
Ubachs, R.L.J.M.
Schreurs, P.J.G.
and
Geers, M.G.D.
2007.
Elasto-viscoplastic nonlocal damage modelling of thermal fatigue in anisotropic lead-free solder.
Mechanics of Materials,
Vol. 39,
Issue. 7,
p.
685.
Pei, Min
and
Qu, Jianmin
2007.
Effect of Rare Earth Elements on Lead-Free Solder Microstructure Evolution.
p.
198.
Erinc, M.
Schreurs, P.J.G.
and
Geers, M.G.D.
2007.
Integrated numerical–experimental analysis of interfacial fatigue fracture in SnAgCu solder joints.
International Journal of Solids and Structures,
Vol. 44,
Issue. 17,
p.
5680.
Lin, Kwang-Lung
and
Lin, Ger-Pin
2007.
The Electromigration Investigation on the Newly Developed Pb-free Sn-Zn-Ag-Al-Ga Solder Ball Interconnect.
p.
1467.
Pei, Min
and
Qu, Jianmin
2008.
Effect of Lanthanum Doping on the Microstructure of Tin-Silver Solder Alloys.
Journal of Electronic Materials,
Vol. 37,
Issue. 3,
p.
331.
Rosalbino, F.
Angelini, E.
Zanicchi, G.
and
Marazza, R.
2008.
Corrosion behaviour assessment of lead-free Sn–Ag–M (M=In, Bi, Cu) solder alloys.
Materials Chemistry and Physics,
Vol. 109,
Issue. 2-3,
p.
386.
Kumar, P.
Cornejo, O.
Dutta, I.
Subbarayan, G.
and
Gupta, V
2008.
Joint Scale Dependence of Aging Kinetics in Sn-Ag-Cu Solders.
p.
903.
Fix, Andreas R.
Nüchter, Wolfgang
and
Wilde, Jürgen
2008.
Microstructural changes of lead‐free solder joints during long‐term ageing, thermal cycling and vibration fatigue.
Soldering & Surface Mount Technology,
Vol. 20,
Issue. 1,
p.
13.
Lall, Pradeep
Hande, Madhura
Bhat, Chandan
More, Vikrant
Vaidya, Rahul
and
Suhling, Jeff
2008.
Algorithms for prognostication of prior damage and residual life in lead-free electronics subjected to thermo-mechanical loads.
p.
638.
Bali, R.
Fleury, E.
Han, S.H.
and
Ahn, J.P.
2008.
Interfacial intermetallic phases and nanoeutectic in rapidly quenched Sn–Ag–Cu on Au under bump metallization.
Journal of Alloys and Compounds,
Vol. 457,
Issue. 1-2,
p.
113.
Lall, Pradeep
Hande, Madhura
Bhat, Chandan
More, Vikrant
and
Vaidya, Rahul
2009.
Prognostication of system-state in lead-free electronics equipment under cyclic and steady-state thermo-mechanical loads.
Microelectronics Reliability,
Vol. 49,
Issue. 8,
p.
825.
Dutta, I.
Kumar, P.
and
Subbarayan, G.
2009.
Microstructural coarsening in Sn-Ag-based solders and its effects on mechanical properties.
JOM,
Vol. 61,
Issue. 6,
p.
29.
Tsao, L. C.
Chang, S. Y.
Sun, W. H.
and
Yen, S. F.
2009.
Study of interfacial reactions between Sn3.5Ag0.5Cu alloys and Cu substrate.
p.
886.
Geers, M.G.D.
Erinc, M.
and
Matin, M.A.
2009.
Multi-scale analysis of solder interconnects in micro-electronics.
p.
1.