Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-08T00:31:00.411Z Has data issue: false hasContentIssue false
  • English
  • Français

Infrared optical properties of pulsed laser deposited carbon films with the bonding and properties of diamond

Published online by Cambridge University Press:  03 March 2011

F. Davanloo ,
J.H. You  and
C.B. Collins
F. Davanloo
Affiliation:
Center for Quantum Electronics, University of Texas at Dallas, P.O. Box 830688, Richardson, Texas 75083-0688
J.H. You
Affiliation:
Center for Quantum Electronics, University of Texas at Dallas, P.O. Box 830688, Richardson, Texas 75083-0688
C.B. Collins
Affiliation:
Center for Quantum Electronics, University of Texas at Dallas, P.O. Box 830688, Richardson, Texas 75083-0688
Get access

Abstract

Composed of packed nanophase nodules in which the carbon atoms are linked with the tetrahedral bonding of diamond, laser plasma films are deposited in vacuum onto almost any substrate by condensing carbon ions carrying keV energies. These multiply charged ions are obtained from the laser ablation of graphite at intensities in excess of 1011 W cm−2. The high energy of condensation provides both for the chemical bonding of such films to a wide variety of substrates and for low values of residual compressive stress. Coatings of 2–5 μm thicknesses have extended lifetimes of important optical materials against the erosive wear from high-speed particles and droplets by factors of tens to thousands. In this work, the optical properties of these films at infrared (IR) wavelengths were studied. Transmission spectra of several freestanding films on silicon frames were measured. Using a model considering rough surface scattering and free carrier absorption, satisfactory fits to these transmission spectra were obtained and from them the optical parameters were extracted. The characterization studies performed in this work indicated a great potential for the laser-deposited nanophase diamond films in optical applications.

Type
Articles
Information
Journal of Materials Research , Volume 10 , Issue 10 , October 1995 , pp. 2548 - 2554
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Collins, C. B., Davanloo, F., Jander, D. R., Lee, T. J., Park, H., and You, J. H., J. Appl. Phys. 69, 7862 (1991).CrossRefGoogle Scholar
2Collins, C. B., Davanloo, F., Jander, D. R., Lee, T. J., You, J. H., Park, H., Pivin, J. C., Glejbøl, K., and Thölén, A.R., J. Appl. Phys. 72, 239 (1992).CrossRefGoogle Scholar
3Collins, C. B., Davanloo, F., Jander, D. R., Lee, T. J., You, J. H., and Park, H., Diamond Films Technol. 2, 25 (1992).Google Scholar
4Collins, C. B., Davanloo, F., Lee, T. J., You, J. H., and Park, H., in Laser Ablation in Materials Processing: Fundamentals and Applications, edited by Braren, B., Dubowski, J. J., and Norton, D. (Mater. Res. Soc. Symp. Proc. 285, Pittsburgh, PA, 1993), p. 547.Google Scholar
5Collins, C. B., Davanloo, F., Lee, T. J., Park, H., and You, J. H., J. Vac. Sci. Technol. B 11, 1936 (1993).CrossRefGoogle Scholar
6Davanloo, F., Juengerman, E. M., Jander, D. R., Lee, T. J., and Collins, C. B., J. Mater. Res. 5, 2398 (1990).CrossRefGoogle Scholar
7Davanloo, F., Lee, T. J., Jander, D. R., Park, H., You, J. H., and Collins, C. B., J. Appl. Phys. 71, 1446 (1992).CrossRefGoogle Scholar
8Collins, C. B., Davanloo, F., Lee, T. J., Jander, D. R., You, J. H., Park, H., and Pivin, J. C., J. Appl. Phys. 71, 3260 (1992).CrossRefGoogle Scholar
9Lee, T. J., Park, H., You, J. H., Davanloo, F., and Collins, C. B., Surf. Coat. Technol. 54/55, 581 (1992).CrossRefGoogle Scholar
10Davanloo, F., Lee, T. J., Park, H., You, J. H., and Collins, C. B., J. Adhesion Sci. Technol. 7, 1323 (1993).CrossRefGoogle Scholar
11Davanloo, F., Lee, T. J., You, J. H., Park, H., and Collins, C. B., Surf. Coat. Technol. 62, 564 (1993).CrossRefGoogle Scholar
12Davanloo, F., Lee, T. J., Park, H., You, J. H., and Collins, C. B., J. Mater. Res. 8, 3090 (1993).CrossRefGoogle Scholar
13Collins, C. B., Davanloo, F., You, J. H., and Park, H., in Laser Applications, edited by Mak, A. A., Proc. SPIE. 2097, 129–138 (1994).CrossRefGoogle Scholar
14Rouard, P. and Bousquet, P., in Process in Optics, edited by Wolf, E. (North-Holland Publishing Company, Amsterdam, 1965), Vol. IV, pp. 145–197.Google Scholar
15Yariv, A., Optical Electronics, 3rd ed. (Holt, Rinehart and Winston, New York, 1985), p. 88.Google Scholar
16Feng, T., in Diamond Optics II, edited by Feldman, A. and Holly, S., Proc. SPIE. 1146, 159–165 (1990).CrossRefGoogle Scholar
17Gatesman, A. J., Giles, R. H., Waldman, J., Bourget, L. P., and Post, R., in Diamond Optics III, edited by Feldman, A. and Holly, S., Proc. SPIE. 1325, 170–177 (1990).Google Scholar
18Bi, X. X., Eklund, P. C., Zhang, J. G., Rao, A. M., Perry, T. A., and Beetz, C.P. Jr., J. Mater. Res. 5, 811 (1990).CrossRefGoogle Scholar
19Cong, Y., Collins, R. W., Epps, G. F., and Windischmann, H., Appl. Phys. Lett. 58, 819 (1991).CrossRefGoogle Scholar
20Snail, K. A., Hanssen, L. M., Morrish, A. A., and Carrington, W. A., in Diamond Optics II, edited by Feldman, A. and Holly, S., Proc. SPIE. 1146, 144–151 (1990).CrossRefGoogle Scholar
21Johnson, C. E. and Weimer, W. A., in Diamond Optics II, edited by Feldman, A. and Holly, S., Proc. SPIE. 1146, 188–191 (1990).CrossRefGoogle Scholar
22Robins, L. H., Farabaugh, E. N., and Feldman, A., in Diamond Optics IV, edited by Feldman, A. and Holly, S., Proc. SPIE. 1534, 105 (1991).CrossRefGoogle Scholar
23Davies, H., Proc. IEEE, Pt. III 101, 209–214 (1954).Google Scholar
24Filinski, I., Phys. Status Solidi B 49, 577 (1972).CrossRefGoogle Scholar
25Bennett, H. E. and Bennett, J. M., in Physics of Thin Films, edited by Hass, G. and Thun, R.E. (Academic Press, New York, 1967), Vol. 4, pp. 1–30.Google Scholar
26Palik, E. D. and Holm, R. T., in Optical Characterization of Semiconductors, edited by Perkowitz, S. (Academic Press, London, 1993), pp. 324–329.Google Scholar
27Wu, R. L. C., Rai, A. K., Garscadden, A., Kee, P., Desai, H. D., and Miyoshi, K., J. Appl. Phys. 72, 110 (1992).CrossRefGoogle Scholar
28Xiong, F., Wang, Y. Y., and Chang, R.P. H., Phys. Rev. B 48, 8016 (1993).CrossRefGoogle Scholar
29Falabella, S., Boercker, D. B., and Sanders, D. M., Thin Solid Films 236, 82 (1993).CrossRefGoogle Scholar
30Davanloo, F., Park, H., and Collins, C. B., in Proc. Int. Conf. on Lasers '94 (in press).Google Scholar
31Davanloo, F., Juengerman, E. M., Jander, D. R., Lee, T. J., and Collins, C. B., J. Appl. Phys. 67, 2081 (1990).CrossRefGoogle Scholar