Hostname: page-component-6bf8c574d5-xtvcr Total loading time: 0 Render date: 2025-02-15T09:02:43.887Z Has data issue: false hasContentIssue false
  • English
  • Français

High-resolution Electron Microscopy Observation of Grain-boundary Films in Superplastically Deformed Silicon Nitride

Published online by Cambridge University Press:  31 January 2011

Guo-Dong Zhan ,
Mamoru Mitomo ,
Yuichi Ikuhara  and
Taketo Sakuma
Guo-Dong Zhan*
Affiliation:
National Institute for Research in Inorganic Materials, Ibaraki 305–0044, Japan
Mamoru Mitomo
Affiliation:
National Institute for Research in Inorganic Materials, Ibaraki 305–0044, Japan
Yuichi Ikuhara
Affiliation:
Department of Materials Science, University of Tokyo, Bunkyo-ku Hongo 7–3-1, Tokyo, Japan
Taketo Sakuma
Affiliation:
Department of Materials Science, University of Tokyo, Bunkyo-ku Hongo 7–3-1, Tokyo, Japan
*
a)Address all correspondence to this author. e-mail: [email protected]
Get access

Abstract

The thickness distribution of grain-boundary films during the superplastic deformation of fine-grained β–silicon nitride was investigated by high-resolution electron microscopy. In particular, grain-boundary thickness was considered with respect to the stress axis in two orientations; namely, parallel and perpendicular to the direction of applied stress. The results showed that the thickness distribution in boundaries perpendicular to the direction of applied stress was unimodal, whereas in parallel boundaries it was bimodal. Moreover, it was found that the majority of film-free boundaries were parallel to the direction of applied stress in the extremely deformed sample. The variation in spacing reflects distribution of stresses within the material due to irregular shape of the grains and the existence of percolating load-bearing paths through the microstructure.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 7 , July 2000 , pp. 1551 - 1555
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Wakai, F., Komada, Y., Sakaguchi, S., Murayama, N., and Niihara, K., Nature (London), 344, 421 (1990).CrossRefGoogle Scholar
2.Rouxel, T., Wakai, F., and Izaki, K., J. Am. Ceram. Soc. 75, 2363 (1992).CrossRefGoogle Scholar
3.Chen, I-W. and Xue, L.A., J. Am. Ceram. Soc. 73, 2585 (1990).CrossRefGoogle Scholar
4.Chen, I-W. and Hwang, S-L., J. Am. Ceram. Soc. 75, 1073 (1992).CrossRefGoogle Scholar
5.Wu, X. and Chen, I-W., J. Am. Ceram. Soc. 75, 2733 (1992).CrossRefGoogle Scholar
6.Hwang, S-L. and Chen, I-W., J. Am. Ceram. Soc. 77, 2775 (1994).Google Scholar
7.Rosenflanz, A. and Chen, I-W., J. Am. Ceram. Soc. 80, 1341 (1997).CrossRefGoogle Scholar
8.Burger, P., Duclos, R., and Crampon, J., J. Am. Ceram. Soc. 80, 879 (1997).CrossRefGoogle Scholar
9.Schneider, J.A. and Mukherjee, A.K., in Ceramic Engineering & Science Proceedings, edited by Greenhut, V. (American Ceramic Society, OH, 1996), Vol. 17, pp. 341–353.Google Scholar
10.Rossignol, F., Rouxel, T., Besson, J.L., Goursat, P., and Lespade, P., J. Phys. III 5, 127 (1995).Google Scholar
11.Rouxel, T., Rossignol, F., Besson, J.L., and Goursat, P., J. Mater. Res. 12, 480 (1997).CrossRefGoogle Scholar
12.Mitomo, M., Hirotsuru, H., Suematsu, H., and Nishimura, T., J. Am. Ceram. Soc. 78, 211 (1995).CrossRefGoogle Scholar
13.Nishimura, T., Bando, Y., Mitomo, M., and Hirotsuru, H., in Fourth Euro Ceramics, Vol. 4, edited by Bellosi, A. (Gruppo Editoriale Fuenza Editrice S.p.A., Riccione, Italy, 1993), pp. 265–270.Google Scholar
14.Wang, C-M., Mitomo, M., Nishimura, T., and Bando, Y., J. Am. Ceram. Soc. 80, 1213 (1997).CrossRefGoogle Scholar
15.Kondo, N., Wakai, F., Nishioka, T., and Yamakawa, A., J. Mater. Sci. Lett. 14, 1369 (1995).CrossRefGoogle Scholar
16.Nishimura, T., Zhan, G-D., Mitomo, M., and Sato, H., in Materials Science Forum (Trans Tech Publications, Switzerland, 1999), Vols. 304–306, pp. 477–482.Google Scholar
17.Schneider, J.A. and Mukherjee, A.K., J. Am. Ceram. Soc. 82, 761 (1999).CrossRefGoogle Scholar
18.Zhan, G-D., Mitomo, M., Nishimura, T., Xie, R-J., Sakuma, T., and Ikuhara, Y., J. Am. Ceram. Soc. 83, 841 (2000).CrossRefGoogle Scholar
19.Zhan, G-D., Mitomo, M., Xie, R-J., and Kurashima, K., Acta Mater. 48, 2373 (2000).CrossRefGoogle Scholar
20.Clarke, D.R. and Thomas, G., J. Am. Ceram. Soc. 60, 491 (1977).CrossRefGoogle Scholar
21.Kleebe, H-J., Hoffman, M.J., and Rühle, M., Z. Metallkd. 83, 610 (1992).Google Scholar
22.Clarke, D.R., J. Am. Ceram. Soc. 70, 15 (1987).CrossRefGoogle Scholar
23.Clarke, D.R., Shaw, T.M., Philipse, A.P., and Horn, R.G., J. Am. Ceram. Soc. 76, 1201 (1993).CrossRefGoogle Scholar
24.Tanaka, I., Kleebe, H-J., Cinibulk, M.K., Bruley, J., Clarke, D.R., and Rühle, M., J. Am. Ceram. Soc. 77, 911 (1994).CrossRefGoogle Scholar
25.Wang, C.M., Pan, X., Hoffman, M.J., Cannon, R.M., and Rühle, M., J. Am. Ceram. Soc. 79, 788 (1996).CrossRefGoogle Scholar
26.Wang, J-G. and Raj, R., J. Am. Ceram. Soc. 67, 399 (1984).CrossRefGoogle Scholar
27.Lange, F.F., Clarke, D.R., and Davis, B.I., J. Mater. Sci. 15, 611 (1980).CrossRefGoogle Scholar
28.Wilkinson, D.S., J. Am. Ceram. Soc. 81, 275 (1998).CrossRefGoogle Scholar
29.Jin, Q., Ning, X-G., Wilkinson, D.S., and Weatherly, G.C., J. Am. Ceram. Soc. 80, 685 (1997).CrossRefGoogle Scholar
30.Jin, Q., Wilkinson, D.S., and Weatherly, G.C., J. Am. Ceram. Soc. 82, 1492 (1999).CrossRefGoogle Scholar
31.Cinibulk, M.K., Kleebe, H-J., and Rühle, M., J. Am. Ceram. Soc. 76, 426 (1993).CrossRefGoogle Scholar
32.Kleebe, H-J., Cinibulk, M.K., Cannon, R.M., and Rühle, M., J. Am. Ceram. Soc. 76, 1969 (1993).CrossRefGoogle Scholar