Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Vermaut, Philippe
Ruterana, P.
Nouet, G.
Salvador, A.
and
Morkoç, H.
1996.
Initial Growth Prismatic Domains in Cyclotron Assisted MBE of GaN/SiC.
MRS Internet Journal of Nitride Semiconductor Research,
Vol. 1,
Issue. ,
Shreter, Y. G.
Rebane, Y. T.
Davis, T. J.
Barnard, J.
Darbyshire, M.
Steeds, J. W.
Perry, W. G.
Bremser, M. D.
and
Davis, R. F.
1996.
Dislocation Luminescence in Wurtzite GaN.
MRS Proceedings,
Vol. 449,
Issue. ,
Christiansen, S.
Albrecht, M.
Dorsch, W.
Strunk, H. P.
Zanotti-Fregonara, C.
Salviati, G.
Pelzmann, A.
Mayer, M.
Kamp, Markus
and
Ebeling, KJ
1996.
Microstructure, growth mechanisms and electro-optical properties of heteroepitaxial GaN layers on sapphire (0001) substrates.
MRS Internet Journal of Nitride Semiconductor Research,
Vol. 1,
Issue. ,
Perry, W. G.
Zheleva, T.
Linthicum, K. J.
Bremser, M. D.
Davis, R. F.
Shan, W.
and
Song, J. J.
1996.
Bound Exciton Energies, Biaxial Strains, and Defect Microstructures in GaN/AlN/6H-SiC(0001) Heterostructures.
MRS Proceedings,
Vol. 449,
Issue. ,
Cheng, Lisen
Zhang, Ze
Zhang, Guoyi
and
Yu, Dapeng
1997.
Effects of buffer layer on formation of domain boundaries in epilayer during film growth of GaN by low-pressure metal–organic vapor phase epitaxy on sapphire substrates.
Applied Physics Letters,
Vol. 71,
Issue. 25,
p.
3694.
Tanaka, Satoru
Iwai, Sohachi
and
Aoyagi, Yoshinobu
1997.
Reduction of the defect density in GaN films using ultra-thin AlN buffer layers on 6H-SiC.
Journal of Crystal Growth,
Vol. 170,
Issue. 1-4,
p.
329.
Potin, V.
Ruterana, P.
and
Nouet, G.
1997.
The atomic structure of {101̄0} inversion domain boundaries in GaN/sapphire layers.
Journal of Applied Physics,
Vol. 82,
Issue. 5,
p.
2176.
Zhou, W. L.
Pirouz, P.
Namavar, F.
Colter, P. C.
Yoganathan, M.
Leksono, M. W.
and
Pankove, J. I.
1997.
Tem Study of Interfaces And Defects in Mocvd-Grown Gan on Sic on Simox.
MRS Proceedings,
Vol. 482,
Issue. ,
Kum, Dongwha
and
Byun, Dongjin
1997.
The effect of substrate surface roughness on GaN growth using MOCVD process.
Journal of Electronic Materials,
Vol. 26,
Issue. 10,
p.
1098.
Sakai, Akira
Sunakawa, Haruo
and
Usui, Akira
1997.
Defect structure in selectively grown GaN films with low threading dislocation density.
Applied Physics Letters,
Vol. 71,
Issue. 16,
p.
2259.
Rosner, S. J.
Carr, E. C.
Ludowise, M. J.
Girolami, G.
and
Erikson, H. I.
1997.
Correlation of cathodoluminescence inhomogeneity with microstructural defects in epitaxial GaN grown by metalorganic chemical-vapor deposition.
Applied Physics Letters,
Vol. 70,
Issue. 4,
p.
420.
Elsner, J.
Jones, R.
Sitch, P. K.
Porezag, V. D.
Elstner, M.
Frauenheim, Th.
Heggie, M. I.
Öberg, S.
and
Briddon, P. R.
1997.
Theory of Threading Edge and Screw Dislocations in GaN.
Physical Review Letters,
Vol. 79,
Issue. 19,
p.
3672.
Ruterana, P
Vermaut, P
Potin, V
Nouet, G
Botchkarev, A
Salvador, A
and
Morkoç, H
1997.
The structure of GaN layers grown on SiC and sapphire by molecular beam epitaxy.
Materials Science and Engineering: B,
Vol. 50,
Issue. 1-3,
p.
72.
Srikant, V.
Speck, J. S.
and
Clarke, D. R.
1997.
Mosaic structure in epitaxial thin films having large lattice mismatch.
Journal of Applied Physics,
Vol. 82,
Issue. 9,
p.
4286.
Wang, N.
Fung, K. K.
Yu, P.
Tang, Z. K.
Wong, G. K. L.
Kawasaki, M.
Ohtomo, A.
Koinuma, H.
and
Segawa, Y.
1997.
Transmission Electron Microscopy Study of Room Temperature Lasing Epitaxial ZnO Films on Sapphire.
MRS Proceedings,
Vol. 482,
Issue. ,
Rouviere, J.L.
Arlery, M.
Daudin, B.
Feuillet, G.
and
Briot, O.
1997.
Transmission electron microscopy structural characterisation of GaN layers grown on (0001) sapphire.
Materials Science and Engineering: B,
Vol. 50,
Issue. 1-3,
p.
61.
Albrecht, M.
Christiansen, S.
Salviati, G.
Zanotti-Fregonara, C.
Rebane, Y. T.
Shreter, Y. G.
Mayer, M.
Pelzmann, A.
Kamp, M.
Ebeling, K. J.
Bremser, M. D.
Davis, R. F.
and
Strunk, H. P.
1997.
Luminescence Related to Stacking Faults in Heterepitaxially Grown Wurtzite GaN.
MRS Proceedings,
Vol. 468,
Issue. ,
Vennéguès, P.
Beaumont, B.
Vaille, M.
and
Gibart, P.
1997.
Study of open-core dislocations in GaN films on (0001) sapphire.
Applied Physics Letters,
Vol. 70,
Issue. 18,
p.
2434.
Pécz, B
di Forte-Poisson, M.A
Tóth, L
Radnóczi, G
Huhn, G
Papaioannou, V
and
Stoemenos, J
1997.
Transmission electron microscopy characterisation of metalorganic chemical vapour deposition grown GaN layers.
Materials Science and Engineering: B,
Vol. 50,
Issue. 1-3,
p.
93.
Cheng, Lisen
Zhang, Guoyi
Yu, Dapeng
and
Zhang, Ze
1997.
Alternative microstructure of GaN nucleation layers grown by low pressure metal-organic vapor phase epitaxy on sapphire substrate.
Applied Physics Letters,
Vol. 70,
Issue. 11,
p.
1408.