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Growth and Characterization of Na0.5K0.5NbO3 Thin Films on Polycrystalline Pt80Ir20 Substrates

Published online by Cambridge University Press:  31 January 2011

Xin Wang ,
Sveinn Olafsson ,
Lynnette D. Madsen ,
Staffan Rudner ,
Ivan P. Ivanov ,
Alex Grishin  and
Ulf Helmersson
Xin Wang
Affiliation:
Department of Physics, Linköping University, SE-581 83 Linköping, Sweden
Sveinn Olafsson
Affiliation:
Department of Physics, Linköping University, SE-581 83 Linköping, Sweden
Lynnette D. Madsen
Affiliation:
Department of Physics, Linköping University, SE-581 83 Linköping, Sweden
Staffan Rudner
Affiliation:
Department of Physics, Linköping University, SE-581 83 Linköping, Sweden, andSwedish Defence Research Agency (FOI), Box 1165, SE-581 11 Linköping, Sweden
Ivan P. Ivanov
Affiliation:
Department of Physics, Linköping University, SE-581 83 Linköping, Sweden
Alex Grishin
Affiliation:
Department of Condensed Matter Physics, Royal Institute of Technology, Electrum 229, SE-164 40 Stockholm-Kista, Sweden
Ulf Helmersson
Affiliation:
Department of Physics, Linköping University, SE-581 83 Linköping, Sweden
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Extract

Na0.5K0.5NbO3 thin films have been deposited onto textured polycrystalline Pt80Ir20 substrates using radio frequency magnetron sputtering. Films were grown in off- and on-axis positions relative to the target at growth temperatures of 500–700 °C and sputtering pressures of 1–7 Pa. The deposited films were found to be textured, displaying a mixture of two orientations (001) and (101). Films grown on-axis showed a prefered (001) orientation, while the off-axis films had a (101) orientation. Scanning electron microscopy showed that the morphology of the films was dependent on the substrate position and sputtering pressure. The low-frequency (10 kHz) dielectric constants of the films were found to be in the range of approximately 490–590. Hydrostatic piezoelectric measurements showed that the films were piezoelectric in the as-deposited form with a constant up to 14.5 pC/N.

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Articles
Information
Journal of Materials Research , Volume 17 , Issue 5 , May 2002 , pp. 1183 - 1191
Copyright
Copyright © Materials Research Society 2002

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