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From small angle x-ray scattering to reflectivity: Instrumentation and sample study

Published online by Cambridge University Press:  31 January 2011

D. W. Hua ,
G. Beaucage  and
M. S. Kent
D. W. Hua
Affiliation:
Center for Micro-Engineered Ceramics, University of New Mexico, Albuquerque, New Mexico 87131–6041
G. Beaucage
Affiliation:
Department of Materials Science and Engineering, University of Cincinnati, Cincinnati, Ohio 45221–0012
M. S. Kent
Affiliation:
Sandia National Laboratory, Albuquerque, New Mexico 87185
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Abstract

In this study, we described the first results from an x-ray reflectometer which has been modified from an existing Kratky small angle x-ray scattering (SAXS) camera at the UNM/Sandia scattering center. Typically, seven orders of magnitude of reflectivity can be obtained over a range of 0.02 to 0.5 Å−1 in q. This allows the resolution of surface features of 10 to 1000 Å. The conversion to reflectometer is reversible and can be achieved in a short time, allowing for dual use of an existing Kratky camera.

Type
Articles
Information
Journal of Materials Research , Volume 11 , Issue 2 , February 1996 , pp. 273 - 276
Copyright
Copyright © Materials Research Society 1996

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References

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