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Formation of SrBi2Ta2O9: Part II. Evidence of a bismuth-deficient pyrochlore phase

Published online by Cambridge University Press:  31 January 2011

Mark A. Rodriguez ,
Timothy J. Boyle ,
Bernadette A. Hernandez ,
Catherine D. Buchheit  and
Michael O. Eatough
Mark A. Rodriguez*
Affiliation:
Sandia National Laboratories, P.O. Box 5800, MS 1405, Albuquerque, New Mexico 87185–1405
Timothy J. Boyle
Affiliation:
Sandia National Laboratories, P.O. Box 5800, MS 1405, Albuquerque, New Mexico 87185–1405
Bernadette A. Hernandez
Affiliation:
Sandia National Laboratories, P.O. Box 5800, MS 1405, Albuquerque, New Mexico 87185–1405
Catherine D. Buchheit
Affiliation:
Sandia National Laboratories, P.O. Box 5800, MS 1405, Albuquerque, New Mexico 87185–1405
Michael O. Eatough
Affiliation:
Sandia National Laboratories, P.O. Box 5800, MS 1405, Albuquerque, New Mexico 87185–1405
*
a)Author to whom correspondence should be addressed
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Abstract

A bismuth-deficient pyrochlore phase has been observed in both powder and film samples fired at 775 °C. The estimated stoichiometry of this pyrochlore (based on calculated diffraction patterns) was Sr0.2(Sr0.5Bi0.7)Ta2O6.75. This bismuth-deficient pyrochlore phase may be considered deleterious to the formation of the SrBi2Ta2O9“SBT” ferroelectric compound since a significant presence of this pyrochlore compound implies a large deviation from the desired cation ratios. Additionally, films prepared on platinized silicon substrates indicate the SBT phase formation may be encouraged by the substrate; there appears to be some 00l preferential orientation for stoichiometric SBT thin films.

Type
Articles
Information
Journal of Materials Research , Volume 11 , Issue 9 , September 1996 , pp. 2282 - 2287
Copyright
Copyright © Materials Research Society 1996

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References

REFERENCES

1.Subbarao, E. C., J. Phys. Chem. Solids 23, 665 (1962).CrossRefGoogle Scholar
2.Paz de Araujo, C. A., Cuchiaro, J. D., McMillian, L.D., Scott, M. C., and Scott, J. F., Nature (London) 374, 627 (1995).CrossRefGoogle Scholar
3.Amanuma, K., Hase, T., and Miyasaka, Y., Appl. Phys. Lett. 66, 221 (1995).CrossRefGoogle Scholar
4.Aurivillius, B., Arkiv. f. Kemi 1, 463 (1949).Google Scholar
5.Shebanov, L. A. and Korzunova, L. V., Mater. Res. Bull. 20, 781 (1985).CrossRefGoogle Scholar
6.Rae, A. D., Thompson, J. G., and Withers, R. L., Acta Crystallogr. B48, 418 (1992).CrossRefGoogle Scholar
7.Thompson, J. G., Rae, A. D., Withers, R.L., and Craig, D.C., Acta Crystallogr. B47, 174 (1991).CrossRefGoogle Scholar
8.Boyle, T. J., Buchheit, C.D., Rodriguez, M.A., Al-Shareef, H.N., and Hernandez, B.A., J. Mater. Res. 11, XXX (1996).CrossRefGoogle Scholar
9.Tuttle, B. A., Headley, T. J., Bunker, B. C., Schwartz, R. W., Zender, T. J., Hernandez, C. L., Goodnow, D. C., Tissot, R.J., Michael, J., and Carim, A. H., J. Mater. Res. 7, 1876 (1992).CrossRefGoogle Scholar
10.Morosin, B., Lawson, A.C., Kwei, G. H., Voigt, J.A., and Tuttle, B.A., edited by Neumann, D.A., Russell, T.P., and Wuench, B.J. (Mater. Res. Soc. Symp. Proc. 376, Pittsburgh, PA, 1996), pp. 609–614.Google Scholar
11.Pannetier, J., J. Phys. Chem. Solids 34, 583 (1973).CrossRefGoogle Scholar
12.Ehlert, M. K., Greedan, J. E., and Subramanian, M. A., J. Solid State Chem. 75, 188 (1988).CrossRefGoogle Scholar
13.Goehner, R. P. and Eatough, M. O., Powder Diffr. 7, 2 (1992).CrossRefGoogle Scholar
14.Takahashi, T., Iwahara, H., and Nagai, Y., J. Appl. Electrochem. 2, 97 (1972).CrossRefGoogle Scholar
15.Takahashi, T., Esaka, T., and Iwahara, H., J. Solid State. Chem. 16, 317 (1976).CrossRefGoogle Scholar
16.Mercurio, D., Champarnaud-Mesjard, J. C., Frit, B., Conflant, P., Boivin, J. C., and Vogt, T., J. Solid State Chem. 112, 1 (1994).CrossRefGoogle Scholar
17.Ami, T., Hironaka, K., Isobe, C., Nagel, N., Sugiyama, M., Ikeda, Y., Wantanabe, K., Machida, A., Miura, K., and Tanaka, M., edited by Desu, S.B., Beach, D. B. and Van Buskirk, P.C. (Mater. Res. Soc. Symp. Proc. 415, Pittsburgh, PA, 1996, in press).Google Scholar