Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-28T07:02:24.631Z Has data issue: false hasContentIssue false

Finite element analysis of nanowire indentation on a flat substrate

Published online by Cambridge University Press:  16 December 2011

Davood Askari
Affiliation:
Department of Mechanical Engineering, Villanova University, Villanova, Pennsylvania 19085
Gang Feng*
Affiliation:
Department of Mechanical Engineering, Villanova University, Villanova, Pennsylvania 19085
*
b)Address all correspondence to this author. e-mail: [email protected]
Get access

Abstract

Nanowires have attracted tremendous research interests due to their potential applications. Their mechanical properties are critical for the reliability and durability of the nanowire-based devices. Compared to many other characterization techniques, the lateral probing of a nanowire using nanoindentation has the advantage of relatively simple sample preparation. However, the data analysis is difficult due to the complex contact mechanics. In all previous studies, some questionable approximations have been made to proceed with data analysis. In this study, a quantitative physical picture of nanowire lateral probing is proposed, which we believe is the first time in the literature. Three-dimensional finite element analysis (FEA) is performed and compared to a double-contact analytical model in which the two contacts, namely contact 1 (indenter/nanowire) and contact 2 (nanowire/substrate), are considered. Both the FEA and analytical models are for a specific case: an elastic spherical indention of a GaN nanowire on a Si substrate. We find that contact 1 cannot be well approximated by a Hertzian elliptical contact as assumed in many studies. We also find a large contact deformation at contact 2, which has been ignored in almost all previous studies. Finally, the adhesion condition and nanowire-receding at contact 2 are found to have insignificant effects on the data analysis.

Type
Articles
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Sirbuly, D.J., Tao, A., Law, M., Fan, R., and Yang, P.: Multifunctional nanowire evanescent wave optical sensors. Adv. Mater. 19, 61 (2007).CrossRefGoogle Scholar
2.Choi, Y.J., Hwang, I.S., Park, J.G., Choi, K.J., Park, J.H., and Lee, J.H.: Novel fabrication of an SnO2 nanowire gas sensor with high sensitivity. Nanotechnology 19, 095508 (2008).CrossRefGoogle ScholarPubMed
3.Dobrokhotov, V.V., Yazdanpanah, M.M., Pabba, S., Safir, A., and Cohn, R.W.: Visual force sensing with flexible nanowire buckling springs. Nanotechnology 19, 035502 (2008).CrossRefGoogle ScholarPubMed
4.Li, M.W., Bhiladvala, R.B., Morrow, T.J., Sioss, J.A., Lew, K.K., Redwing, J.M., Keating, C.D., and Mayer, T.S.: Bottom-up assembly of large-area nanowire resonator arrays. Nat. Nanotechnol. 3, 88 (2008).CrossRefGoogle ScholarPubMed
5.Tay, A.B.H. and Thong, J.T.L.: High-resolution nanowire atomic force microscope probe grown by a field-emission induced process. Appl. Phys. Lett. 84, 5207 (2004).CrossRefGoogle Scholar
6.Bao, S.P. and Tjong, S.C.: Mechanical behaviors of polypropylene/carbon nanotube nanocomposites: The effects of loading rate and temperature. Mater. Sci. Eng., A 485, 508 (2008).CrossRefGoogle Scholar
7.Ajayan, P.M., Schadler, L.S., and Braun, P.V.: Nanocomposite Science and Technology (Wiley-VCH, Weinheim, 2003).CrossRefGoogle Scholar
8.Li, X.D., Nardi, P., Baek, C.W., Kim, J.M., and Kim, Y.K.: Direct nanomechanical machining of gold nanowires using a nanoindenter and an atomic force microscope. J. Micromech. Microeng. 15, 551 (2005).CrossRefGoogle Scholar
9.Feng, G., Nix, W.D., Yoon, Y., and Lee, C.J.: A study of the mechanical properties of nanowires using nanoindentation. J. Appl. Phys. 99, 074304 (2006).CrossRefGoogle Scholar
10.Li, X.D., Gao, H.S., Murphy, C.J., and Caswell, K.K.: Nanoindentation of silver nanowires. Nano Lett. 3, 1495 (2003).CrossRefGoogle Scholar
11.Yu, M.F., Kowalewski, T., and Ruoff, R.S.: Investigation of the radial deformability of individual carbon nanotubes under controlled indentation force. Phys. Rev. Lett. 85, 1456 (2000).CrossRefGoogle ScholarPubMed
12.Minary-Jolandan, M. and Yu, M.F.: Reversible radial deformation up to the complete flattening of carbon nanotubes in nanoindentation. J. Appl. Phys. 103, 073516 (2008).CrossRefGoogle Scholar
13.Ni, H., Li, X.D., Cheng, G.S., and Klie, R.: Elastic modulus of single-crystal GaN nanowires. J. Mater. Res. 21, 2882 (2006).CrossRefGoogle Scholar
14.Fang, T-H. and Chang, W-J.: Nanolithography and nanoindentation of tantalum-oxide nanowires and nanodots using scanning-probe microscopy. Physica B 352, 190 (2004).CrossRefGoogle Scholar
15.Mao, S.X., Zhao, M., and Wang, Z.L.: Nanoscale mechanical behavior of individual semiconducting nanobelts. Appl. Phys. Lett. 83, 993 (2003).CrossRefGoogle Scholar
16.Tan, E.P.S. and Lim, C.T.: Nanoindentation study of nanofibers. Appl. Phys. Lett. 87, 123106 (2005).CrossRefGoogle Scholar
17.Lonnroth, N., Muhlstein, C.L., Pantano, C., and Yue, Y.: Nanoindentation of glass wool fibers. J. Non-Cryst. Solids 354, 3887 (2008).CrossRefGoogle Scholar
18.Ni, H. and Li, X.D.: Young’s modulus of ZnO nanobelts measured using atomic force microscopy and nanoindentation techniques. Nanotechnology 17, 3591 (2006).CrossRefGoogle ScholarPubMed
19.Oliver, W.C. and Pharr, G.M.: An improved technique for determining hardness and elastic-modulus using load and displacement sensing indentation experiments. J. Mater. Res. 7, 1564 (1992).CrossRefGoogle Scholar
20.Johnson, K.L.: Contact Mechanics (Cambridge University Press, Cambridge, New York, 1987).Google Scholar
21.Contact Technology Guide, Vol. 12.1 (ANSYS, Inc., Canonsburg, PA, 2009).Google Scholar
22.Castillo, J. and Barber, J.R.: Lateral contact of slender prismatic bodies. Proc. Math. Phys. Eng. Sci. 453, 2397 (1997).CrossRefGoogle Scholar
23.Xu, Z.H. and Li, X.D.: Sample size effect on nanoindentation of micro-/nanostructures. Acta Mater. 54, 1699 (2006).CrossRefGoogle Scholar
24.Pharr, G.M., Oliver, W.C., and Brotzen, F.R.: On the generality of the relationship among contact stiffness, contact area, and elastic-modulus during indentation. J. Mater. Res. 7, 613 (1992).CrossRefGoogle Scholar