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Epitaxial co-deposition growth of CaGe2 films by molecular beam epitaxy for large area germanane

Published online by Cambridge University Press:  27 January 2014

Igor V. Pinchuk
Affiliation:
Department of Physics, The Ohio State University, Columbus, Ohio 43210; and Department of Physics and Astronomy, University of California, Riverside, California 92521
Patrick M. Odenthal
Affiliation:
Department of Physics and Astronomy, University of California, Riverside, California 92521
Adam S. Ahmed
Affiliation:
Department of Physics, The Ohio State University, Columbus, Ohio 43210
Walid Amamou
Affiliation:
Department of Physics and Astronomy, University of California, Riverside, California 92521
Joshua E. Goldberger*
Affiliation:
Department of Chemistry, The Ohio State University, Columbus, Ohio 43210
Roland K. Kawakami*
Affiliation:
Department of Physics, The Ohio State University, Columbus, Ohio 43210; and Department of Physics and Astronomy, University of California, Riverside, California 92521
*
b)Address all correspondence to this author. e-mail: [email protected]
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Abstract

Two-dimensional crystals are an important class of materials for novel physics, chemistry, and engineering. Germanane (GeH), the germanium-based analogue of graphane (CH), is of particular interest due to its direct band gap and spin–orbit coupling. Here, we report the successful co-deposition growth of CaGe2 films on Ge(111) substrates by molecular beam epitaxy and their subsequent conversion to germanane by immersion in hydrochloric acid. We find that the growth of CaGe2 occurs within an adsorption-limited growth regime, which ensures stoichiometry of the film. We utilize in situ reflection high energy electron diffraction (RHEED) to explore the growth temperature window and find the best RHEED patterns at 750 °C. Finally, the CaGe2 films are immersed in hydrochloric acid to convert the films to germanane. Auger electron spectroscopy of the resulting film indicates the removal of Ca, and RHEED patterns indicate a single-crystal film with an in-plane orientation dictated by the underlying Ge(111) substrate. X-ray diffraction and Raman spectroscopy indicate that the resulting films are indeed germanane. Ex situ atomic force microscopy shows that the grain size of the germanane is on the order of a few micrometers, being primarily limited by terraces induced by the miscut of the Ge substrate. Thus, optimization of the substrate could lead to the long-term goal of large area germanane films.

Type
Invited Papers
Copyright
Copyright © Materials Research Society 2014 

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References

REFERENCES

Novoselov, K.S., Geim, A.K., Morozov, S.V., Jiang, D., Katsnelson, M.I., Grigorieva, I.V., Dubonos, S.V., and Firsov, A.A.: Two-dimensional gas of massless Dirac fermions in graphene. Nature 438, 197200 (2005).CrossRefGoogle ScholarPubMed
Zhang, Y., Tan, Y-W., Stormer, H.L., and Kim, P.: Experimental observation of the quantum Hall effect and Berry's phase in graphene. Nature 438, 201204 (2005).CrossRefGoogle ScholarPubMed
Geim, A.K. and Novoselov, K.S.: The rise of graphene. Nat. Mater. 6, 183191 (2007).CrossRefGoogle ScholarPubMed
Butler, S., Hollen, S.M., Cao, L., Cui, Y., Gupta, J., Gutierrez, H.R., Heinz, T.F., Hong, S.S., Huang, J., Ismach, A.F., Johnston-Halperin, E., Kuno, M., Plashnitsa, V.V., Robinson, R.D., Ruoff, R.S., Salahuddin, S., Shan, J., Shi, L., Spencer, M.G., Terrones, M., Windl, W., and Goldberger, J.E.: Progress, challenges, and opportunities in two-dimensional materials beyond graphene. ACS Nano 7, 28982926 (2013).CrossRefGoogle ScholarPubMed
Bianco, E., Butler, S., Jiang, S., Restrepo, O., Windl, W., and Goldberger, J.E.: Stability and exfoliation of germanane: A germanium graphane analogue. ACS Nano 7, 44144421 (2013).CrossRefGoogle ScholarPubMed
Kato, Y., Myers, R.C., Gossard, A.C., and Awschalom, D.D.: Coherent spin manipulation without magnetic fields in strained semiconductors. Nature 427, 5053 (2004).CrossRefGoogle ScholarPubMed
Kato, Y.K., Myers, R.C., Gossard, A.C., and Awschalom, D.D.: Observation of the spin Hall effect in semiconductors. Science 306, 19101913 (2004).CrossRefGoogle ScholarPubMed
Konig, M., Wiedmann, S., Brune, C., Roth, A., Buhmann, H., Molenkamp, L.W., Qi, X-L., and Zhang, S-C.: Quantum spin hall insulator state in HgTe quantum Wells. Science 318, 766770 (2007).CrossRefGoogle Scholar
Vogg, G., Miesner, C., Brandt, M.S., Stutzmann, M., and Abstreiter, G.: Epitaxial alloy films of Zintl-phase Ca(Si1-xGex)2 . J. Cryst. Growth 223, 573576 (2001).CrossRefGoogle Scholar
Morar, J.F. and Wittmer, M.: Metallic CaSi2 epitaxial films on Si(111). Phys. Rev. B 37, 26182621 (1988).CrossRefGoogle ScholarPubMed
Vogg, G., Brandt, M.S., and Stutzmann, M.: Polygermyne—A prototype system for layered germanium polymers. Adv. Mater. 12, 12781281 (2000).3.0.CO;2-Y>CrossRefGoogle Scholar
Palmberg, P.W. and Peria, W.T.: Low energy electron diffraction studies of Ge and Na-covered Ge. Surf. Sci. 6, 5797 (1967).CrossRefGoogle Scholar
Ichikawa, T. and Ino, S.: Double diffraction spots in RHEED patterns from clean Ge(111) and Si(001) surfaces. Surf. Sci. 85, 221243 (1979).CrossRefGoogle Scholar
Ichikawa, T. and Ino, S.: RHEED study on the Ge/Si(111) and Si/Ge(111) systems: Reaction of Ge with the Si(111)(7x7) surface. Surf. Sci. 136, 267284 (1984).CrossRefGoogle Scholar
Harris, J.J., Joyce, B.A., and Dobson, P.J.: Oscillations in the surface structure of Sn-doped GaAs during growth by MBE. Surf. Sci. Lett. 103, L90L96 (1981).Google Scholar
Neave, J.H., Joyce, B.A., Dobson, P.J., and Norton, N.: Dynamics of film growth of GaAs by MBE from RHEED observations. Appl. Phys. A 31, 18 (1983).CrossRefGoogle Scholar
Ulbricht, R.W., Schmehl, A., Heeg, T., Schubert, J., and Schlom, D.G.: Adsorption-controlled growth of EuO by molecular-beam epitaxy. Appl. Phys. Lett. 93, 102105 (2008).CrossRefGoogle Scholar
Zhang, G., Qin, H., Teng, J., Guo, J., Guo, Q., Dai, X., Fang, Z., and Wu, K.: Quintuple-layer epitaxy of thin films of topological insulator Bi2Se3 . Appl. Phys. Lett. 95, 053114 (2009).CrossRefGoogle Scholar
Swartz, A.G., Ciraldo, J., Wong, J.J.I.W., Li, Y., Han, W., Lin, T., Mack, S., Awschalom, D.D., and Kawakami, R.K.: Epitaxial EuO thin films on GaAs. Appl. Phys. Lett. 97, 112509 (2010).CrossRefGoogle Scholar
Palenzona, A., Manfrinetti, P., and Fornasini, M.L.: The phase diagram of the Ca-Ge system. J. Alloys Compd. 345, 144147 (2002).CrossRefGoogle Scholar