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Deformation microstructure under microindents in single-crystal Cu using three-dimensional x-ray structural microscopy

Published online by Cambridge University Press:  03 March 2011

Wenge Yang ,
B.C. Larson ,
G.M. Pharr ,
G.E. Ice ,
J.D. Budai ,
J.Z. Tischler  and
Wenjun Liu
Wenge Yang
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
B.C. Larson
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
G.M. Pharr
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831; and University of Tennessee, Knoxville, Tennessee 37996
G.E. Ice
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
J.D. Budai
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
J.Z. Tischler
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
Wenjun Liu
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
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Abstract

The use of three-dimensional x-ray structural microscopy for nondestructive investigations of the deformation microstructure under microindents was demonstrated. Point to point, micrometer-resolution x-ray microbeam measurements of local lattice rotations were made for selected positions under 100-mN Berkovich and conical indents in single-crystal copper. Local lattice orientation measurements were used to extract micrometer by micrometer lattice misorientations and rotation axes along x-ray microbeams. Measurements of the deformation microstructure in symmetry and off-symmetry geometries are reported and discussed in terms of their potential for fundamental deformation investigations.

Keywords

IndentationX-ray diffraction (XRD)Microstructure
Type
Articles
Information
Journal of Materials Research , Volume 19 , Issue 1 , January 2004 , pp. 66 - 72
Copyright
Copyright © Materials Research Society 2004

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