Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-28T05:03:20.744Z Has data issue: false hasContentIssue false
  • English
  • Français

A Comparison of Pseudomorphic Bcc Phase Stability in Zr/Nb and Ti/Nb Thin Film Multilayers

Published online by Cambridge University Press:  03 March 2011

G.B. Thompson ,
R. Banerjee ,
S.A. Dregia ,
M.K. Miller  and
H.L. Fraser
G.B. Thompson
Affiliation:
Materials Science and Engineering Department, The Ohio State University, Columbus, Ohio 43210
R. Banerjee
Affiliation:
Materials Science and Engineering Department, The Ohio State University, Columbus, Ohio 43210
S.A. Dregia
Affiliation:
Materials Science and Engineering Department, The Ohio State University, Columbus, Ohio 43210
M.K. Miller
Affiliation:
Metals and Ceramic Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
H.L. Fraser
Affiliation:
Materials Science and Engineering Department, The Ohio State University, Columbus, Ohio 43210
Get access

Abstract

A series of Nb-rich Zr/Nb and Ti/Nb multilayers were sputter deposited. Upon a reduction in thickness, a pseudomorphic bcc phase was stabilized in the Zr and Ti layers. X-ray and electron diffraction techniques were used to confirm these phase transformations. The change in phase stability was modeled by the competition between volumetric and interfacial components of the total free energy of a unit bilayer representing the multilayer. An outcome of this model is the ability to plot phase stability diagrams for multilayers, referred to as biphase diagrams, as a function of bilayer thickness and volume fraction. A comparison of the phase stability boundary between hcp/bcc and bcc/bcc for these two systems has shown that the bcc Ti’s pseudomorphic phase stabilization is maintained for a much larger layer thickness as compared to Zr. Atom probe compositional profiles of the Ti/Nb multilayers have indicated that the Nb layers interdiffused into the Ti layers thus helping to facilitate the bcc Ti phase stability in the Ti/Nb multilayers.

Keywords

Phase equilibriaCrystallographic structureThin film
Type
Articles
Information
Journal of Materials Research , Volume 19 , Issue 3 , March 2004 , pp. 707 - 715
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Clarke, R., Lamelas, F., Uher, C., Flynn, C.P. and Cunningham, J.E., Phys. Rev. B 34 2022 (1986).Google Scholar
2Wormeester, H., Huger, E. and Bauer, E., Phys. Rev. Lett. 77 1540 (1996).Google Scholar
3Prinz, G.A., Phys. Rev. Lett. 54 1051 (1985).Google Scholar
4Lowe, W.P. and Geballe, T.H., Phys. Rev. B 29 4961 (1984).Google Scholar
5Metoki, N., Donner, W. and Zabel, H., Phys. Rev. B 49 17351 (1994).Google Scholar
6Banerjee, R., Dregia, S.A. and Fraser, H.L., Acta Mater. 47 4225 (1999).Google Scholar
7Dregia, S. A., Banerjee, R. and Fraser, H.L., Scr. Mater. 39 217 (1998).Google Scholar
8Thompson, G.B., Banerjee, R., Dregia, S.A. and Fraser, H.L., Acta Mater. 51 5285 (2003).Google Scholar
9Guillermet, A.I., Zeitshrift fur Metallkunde 82 478 (1991).Google Scholar
10Kaufman, L. and Nesor, H., Calphad 2 81 (1978).Google Scholar
11Bonevich, J., van Heerden, D. and Josell, D., J. Mater. Res. 14 1977 (1999).Google Scholar
12Banerjee, R., Dregia, S.A. and Fraser, H.L., Acta Mater. 47 4225 (1999).CrossRefGoogle Scholar
13Zheng, J.Q., Ketterson, J.B., Falco, C.M. and Schuller, I.K., Physica 108B 290 (1981).Google Scholar
14 Smithells Metals Handbook, 7th ed., edited by Brandes, E.A. and Brook, G.B. (Butterworth and Heinemann Ltd., London, U.K. 1992).Google Scholar
15Larson, D.J., Wissman, B.D., Viellieux, R.J., Martens, RL., Gribb, T.T., Erskine, H.F., Kelly, T.F. and Tabat, N., Microscopy and Microanalysis. 7 24 (2001).CrossRefGoogle Scholar
16Thompson, G.B., Fraser, H.L., and Miller, M.K., Ultramicroscopy (2004, in press).Google Scholar
17van der Merwe, J.H., J. Appl. Phys. 34 117 (1963).Google Scholar
18van der Merwe, J.H., Proceedings of the Physical Society of London, Sec. A 63 616 (1950).Google Scholar
19Chen, Q. and Sundman, B., Acta Mater. 49 947 (2001).Google Scholar
20Banerjee, R., Vasa, P., Thompson, G.B., Ayyub, P. and Fraser, H.L., Solid State Commun. 127 349 (2003).CrossRefGoogle Scholar
21Thompson, G.B., Miller, M.K., Banerjee, R. and Fraser, H.L. in Continuous Nanophase and Nanostructured Materials, edited by Komarneni, S., Parker, J.C., and Watkins, J. (Mater. Res. Soc. Symp. Proc. 788, Warrendale, PA, 2003), p. L2.8.1.Google Scholar