Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-24T08:30:35.482Z Has data issue: false hasContentIssue false

Characterization of CeO2 Fine Particles Prepared by the Homogeneous Precipitation Method with a Mixed Solutionof Ethylene Glycol and Polyethylene Glycol

Published online by Cambridge University Press:  03 March 2011

Naofumi Uekawa*
Affiliation:
Department of Materials Technology, Faculty of Engineering, and Center for Frontier Electronics and Photonics, Chiba University, Inage-ku, Chiba-shi 263-8522, Japan
Masayuki Ueta
Affiliation:
Department of Materials Technology, Faculty of Engineering, Chiba University, Inage-ku, Chiba-shi 263-8522, Japan
Yong Jun Wu
Affiliation:
Center for Frontier Electronics and Photonics, Chiba University, Inage-ku, Chiba-shi 263-8522, Japan
Kazuyuki Kakegawa
Affiliation:
Department of Materials Technology, Faculty of Engineering, and Center for Frontier Electronics and Photonics, Chiba University, Inage-ku, Chiba-shi 263-8522, Japan
*
a)Address all correspondence to this author. e-mail: [email protected]
Get access

Abstract

Cerium oxide (CeO2) nanoparticles were obtained by heating a polyethylene glycol (PEG) solution of cerium nitrate hydrate [Ce(NO3)3 6H2O] at 383 K for 3 h. When the PEG, whose molecular weight was 20,000, was used for the preparation, the monodispersed CeO2, whose particle size was about 102 nm, was obtained. When the mixture of PEG20,000 and ethylene glycol (EG) was used to prepare the PEG solution of cerium nitrate hydrate, the average particle size increased from 102 nm to 660 nm with an increase in the EG content of the solution. The pore structure in the obtained CeO2 particles also depended on the weight ratio between EG and PEG20,000.

Type
Articles
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Kofstad, P.: Nonstoichiometry, Diffusion, and Electrical Conductivity in Binary Metal Oxides (Wiley-Interscience, New York, 1972), Chap 12Google Scholar
2Inaba, I.H. and Tagawa, H.: Solid State Ionics. 83, 1 (1996).CrossRefGoogle Scholar
3Yabe, S., Yamashita, M., Momose, S., Tahira, K., Yoshida, S., Li, R., Yin, S. and Sato, T.: Int. J. Inorg. Mater. 3, 1003 (2001).CrossRefGoogle Scholar
4Li, R., Yabe, S., Yamashita, M., Momose, S., Yoshida, S., Yin, S. and Sato, T.: Mater. Chem. Phys. 75, 39 (2002).CrossRefGoogle Scholar
5Hirano, M. and Kato, E.: J. Am. Ceram. Soc. 79, 777 (1996).CrossRefGoogle Scholar
6Yang, X. and Rahaman, M.N.: J. Eur. Ceram. Soc. 17, 525 (1997).CrossRefGoogle Scholar
7Zhitomirsky, I. and Petric, A.: Ceram. Int. 27, 149 (2001).CrossRefGoogle Scholar
8Nakane, S., Tachi, T., Yoshinaka, M., Hirota, K. and Yamaguchi, O.: J. Am. Ceram. Soc. 80, 3221 (1997).CrossRefGoogle Scholar
9Djuričić, B.; and Pickering, S., Eur, J.. Ceram. Soc. 19, 1925 (1999).Google Scholar
10Chen, P-L. and Chen, I-W.: J. Am. Ceram. Soc. 76, 1577 (1993).CrossRefGoogle Scholar
11Uekawa, N., Endo, M., Kakegawa, K. and Sasaki, Y.: Phys. Chem. Chem. Phys. 2, 5485 (2000).CrossRefGoogle Scholar
12Uekawa, N., Sukegawa, T., Kakegawa, K. and Sasaki, Y.: J. Am. Ceram. Soc. 85, 329 (2002).CrossRefGoogle Scholar
13 N. Uekawa, M. Ueta, Y.J. Wu, and K. Kakegawa: Chem. Lett. 2002, 854 (2002).Google Scholar
14Livage, J., Henry, M. and Sanchez, C.: Prog. Solid State Chem. 18, 259 (1988).CrossRefGoogle Scholar
15Jolivet, J.P.: Metal Oxide Chemistry and Synthesis (John Wiley & Sons, New York, 2000), Chap. 5Google Scholar
16Nakamoto, K.: Infrared and Raman Spectra of Inorganic and Coordination Compounds (John Wiley & Sons, New York, 1986), p. 115Google Scholar
17Griffiths, T.R., Hubbard, H.V.A. and Davies, M.J.: Inorg. Chim. Acta. 225, 305 (1994).CrossRefGoogle Scholar
18Özer, N.: Solar Energy Mater. Solar Cells. 68, 391 (2001).CrossRefGoogle Scholar
19Jolivet, J.P.: Metal Oxide Chemistry and Synthesis (John Wiley & Sons, New York, 2000), p. 141.Google Scholar