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Life distribution properties of devices subject to a pure jump damage process

Published online by Cambridge University Press:  14 July 2016

Mohamed Abdel-Hameed
Mohamed Abdel-Hameed*
Affiliation:
University of North Carolina, Charlotte
*
∗Present address: Department of Mathematics, Kuwait University, P.O. Box 5969, Kuwait.
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Abstract

A device is subject to damage. The damage occurs randomly in time according to a pure jump process. The device has a threshold and it fails once the damage exceeds the threshold. We show that life distribution properties of the threshold right tail probability are inherited as corresponding properties of the survival probability, under suitable conditions on the parameters of the damage process. Moreover we discuss an optimal replacement problem for such devices.

Keywords

PURE JUMP PROCESSESTOTAL POSITIVITYOPTIMAL REPLACEMENT POLICIES
Type
Research Papers
Information
Journal of Applied Probability , Volume 21 , Issue 4 , December 1984 , pp. 816 - 825
Copyright
Copyright © Applied Probability Trust 1984 

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Footnotes

Research supported by the United States Air Force Office of Scientific Research under Grant Afosr 80–0245C.

References

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