Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-28T04:32:08.572Z Has data issue: false hasContentIssue false

Availability of periodically inspected systems subject to Markovian degradation

Published online by Cambridge University Press:  14 July 2016

Peter C. Kiessler*
Affiliation:
Clemson University
Georgia-Ann Klutke*
Affiliation:
Texas A&M University
Yoonjung Yang*
Affiliation:
Samsung Electronics Co. Ltd
*
Postal address: Department of Mathematical Sciences, Clemson University, Clemson, SC 29634-0975, USA.
∗∗ Postal address: Department of Industrial Engineering, Texas A&M University, College Station, TX 77843-3131, USA. Email address: [email protected]
∗∗∗ Postal address: SCM Group, Memory Division, Samsung Electronics Co. Ltd, San #16 Banwol-Ri, Taean-Eup, Hwasung City, Kyunggi 445-701, Republic of Korea.

Abstract

This paper studies inspected systems with non-self-announcing failures where the rate of deterioration is governed by a Markov chain. We compute the lifetime distribution and availability when the system is inspected according to a periodic inspection policy. In doing so, we expose the role of certain transient distributions of the environment.

Type
Research Papers
Copyright
Copyright © Applied Probability Trust 2002 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1]. Çinlar, E. (1975). Introduction to Stochastic Processes. Prentice-Hall, Englewood Cliffs, NJ.Google Scholar
[2]. Çinlar, E. (1984). Markov and semi-Markov models of deterioration. In Reliability Theory and Models, eds Abdel-Hamid, M., Çinlar, E. and Quinn, J., Academic Press, New York, pp. 341.CrossRefGoogle Scholar
[3]. Çinlar, E. and Özekici, S. (1987). Reliability of complex devices in random environments. Prob. Eng. Inf. Sci. 3, 97115.Google Scholar
[4]. Çinlar, E., Shaked, M., and Shanthikumar, J. G. (1989). On lifetimes influenced by a common environment. Stoch. Process. Appl. 33, 347359.Google Scholar
[5]. Horn, R. A., and Johnson, C. R. (1991). Topics in Matrix Analysis. Cambridge University Press.Google Scholar
[6]. Klutke, G.-A., Wortman, M., and Ayhan, H. (1996). The availability of inspected systems subject to random deterioration. Prob. Eng. Inf. Sci. 10, 109118.CrossRefGoogle Scholar
[7]. Lefèvre, C., and Milhaud, X. (1990). On the association of the lifelengths of components subjected to a stochastic environemt. Adv. Appl. Prob. 22, 961964.Google Scholar
[8]. Özekici, S. (1995). Optimal maintenance policies in random environments. Europ. J. Operat. Res. 82, 283294.CrossRefGoogle Scholar
[9]. Özekici, S. (1996). Complex systems in random environments. In Reliability and Maintenance of Complex Systems, ed Özekici, S., Springer, New York, pp. 137157.CrossRefGoogle Scholar
[10]. Pitman, J. W., and Speed, T. P. (1973). A note on random times. Stoch. Process. Appl. 1, 369374.CrossRefGoogle Scholar
[11]. Rogers, L. C. G., and Williams, D. (1987). Diffusions, Markov Processes and Martingales, Vol. 2, Itô Calculus. John Wiley, New York.Google Scholar
[12]. Ross, S. M. (1996). Stochastic Processes, 2nd edn. John Wiley, New York.Google Scholar
[13]. Rudin, W. (1987). Real and Complex Analysis, 3rd edn. McGraw-Hill, Boston, MA.Google Scholar
[14]. Shaked, M., and Shanthikumar, J. G. (1989). Some replacement policies in a random environment. Prob. Eng. Inf. Sci. 3, 117134.CrossRefGoogle Scholar
[15]. Stroock, D. W. (1999). A Concise Introduction to the Theory of Integration, 3rd edn. Birkhäuser, Boston, MA.Google Scholar
[16]. Wortman, M., and Klutke, G.-A. (1994). On maintained systems operating in a random environment. J. Appl. Prob. 31, 589594.CrossRefGoogle Scholar
[17]. Yang, Y., and Klutke, G.-A. (2000). Improved inspection schemes for deteriorating equipment. Prob. Eng. Inf. Sci. 14, 445460.Google Scholar
[18]. Yang, Y., and Klutke, G.-A. (2000). Lifetime characteristics and inspection schemes for Lévy degradation processes. IEEE Trans. Reliab. 49, 377382.CrossRefGoogle Scholar