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An analysis of the factors determining yields in crosses between semi-dwarf and taller wheat varieties

Published online by Cambridge University Press:  27 March 2009

F. G. H. Lupton ,
R. H. Oliver  and
P. Ruckenbauer
F. G. H. Lupton
Affiliation:
The Plant Breeding Institute, Moris Lane, Trumpington, Cambridge
R. H. Oliver
Affiliation:
The Plant Breeding Institute, Moris Lane, Trumpington, Cambridge
P. Ruckenbauer
Affiliation:
Institut für Pflanzenzuchtung, Hochschule für Bodenkultur, 33 Gregor Mendelstrasse, 1180 Vienna, Austria
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Summary

The growth and development of two semi-dwarf winter wheat varieties, of two taller varieties, and of random selections from two crosses between semi-dwarf and taller varieties were compared over 2 years. Changes with time of crop dry weight/m2, leaf area index and ear size were expressed as orthogonal polynomial regression coefficients. Significant correlations were obtained between yield, the polynomial coefficients and growth measurements relating to number of tillers and flag leaf area duration, but many of these variables were significantly correlated with each other. Multiple regression equations were therefore calculated expressing yield in terms of the variables. These showed flag leaf area duration and rate of ear growth to be the most important characters determining crop yield. The greatest reduction in total yield variance was obtained by the simultaneous consideration of characters relating to photosynthetic capacity and ear development. The significance of this finding in relation to the relative importance of ‘apos;source’ and ‘sink’ in determining grain yield are discussed.

Type
Research Article
Information
The Journal of Agricultural Science , Volume 82 , Issue 3 , June 1974 , pp. 483 - 496
Copyright
Copyright © Cambridge University Press 1974

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References

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