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Robust and fast near-field antenna measurement technique

Published online by Cambridge University Press:  29 April 2016

Po-Jui Chiu ,
Wei-Chung Cheng ,
Dong-Chen Tsai  and
Zuo-Min Tsai
Po-Jui Chiu
Affiliation:
Department of Electrical Engineering, National Chung-Cheng University, No.168, Sec. 1, University Rd., Min-Hsiung Township, Chia-yi County 621, Taiwan. Phone: +886 5 720411 #33216
Wei-Chung Cheng
Affiliation:
Department of Electrical Engineering, National Chung-Cheng University, No.168, Sec. 1, University Rd., Min-Hsiung Township, Chia-yi County 621, Taiwan. Phone: +886 5 720411 #33216
Dong-Chen Tsai
Affiliation:
Department of Electrical Engineering, National Chung-Cheng University, No.168, Sec. 1, University Rd., Min-Hsiung Township, Chia-yi County 621, Taiwan. Phone: +886 5 720411 #33216
Zuo-Min Tsai*
Affiliation:
Department of Electrical Engineering, National Chung-Cheng University, No.168, Sec. 1, University Rd., Min-Hsiung Township, Chia-yi County 621, Taiwan. Phone: +886 5 720411 #33216
*
Corresponding author:Z.-M. Tsai Email: [email protected]
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Abstract

Traditional near-field antenna measurements use the sampling theorem to reconstruct the antenna pattern perfectly. However, a large number of measurement points are required for this approach. To address this problem, in this study, we propose a technique to accelerate the near-field antenna measurement, which is achieved by sparse E-field sampling in the region where the E-field changes smoothly and dense sampling in the region where the field changes rapidly. Further, our approach ensures robustness of measurement; the E-field information need not be known before carrying out measurements. Our experimental results demonstrate that our technique can reduce the number of measuring points by at least 64.9% when measuring two different patterns (15-GHz horn antenna with θ = 0° and 10°).

Keywords

Antenna measurementInterpolationNear-field to far-fieldSampling theorem
Type
Research Papers
Information
International Journal of Microwave and Wireless Technologies , Volume 8 , Special Issue 4-5: EuMW 2015 Special Issue , June 2016 , pp. 777 - 784
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2016 

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References

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