Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-15T17:12:52.340Z Has data issue: false hasContentIssue false
  • English
  • Français

Phase noise performance stabilization of PLL system under dynamic vibration condition for airborne applications

Published online by Cambridge University Press:  30 July 2020

Vipin Kumar Open the ORCID record for Vipin Kumar [Opens in a new window] ,
R. Sivakumar ,
C. S. Jayasheela ,
Mahadev Sarkar  and
Shailendra Singh
Vipin Kumar*
Affiliation:
Product Development and Innovation Center, Bharat Electronics Limited, Bangalore560013, India
R. Sivakumar
Affiliation:
Product Development and Innovation Center, Bharat Electronics Limited, Bangalore560013, India
C. S. Jayasheela
Affiliation:
Product Development and Innovation Center, Bharat Electronics Limited, Bangalore560013, India
Mahadev Sarkar
Affiliation:
Product Development and Innovation Center, Bharat Electronics Limited, Bangalore560013, India
Shailendra Singh
Affiliation:
Product Development and Innovation Center, Bharat Electronics Limited, Bangalore560013, India
*
Author for correspondence: Vipin Kumar, E-mail: [email protected]
Get access Rights & Permissions [Opens in a new window]

Abstract

The purpose of this paper is to disclose improved crystal based frequency source system covering design techniques and experimental methodologies for the stabilization of phase noise performance of X-band phase-locked loop (PLL) at 10.6 GHz. Phase noise performance of PLL-based unit under test (UUT) is prone to disturbance occurred in random vibration profile frequency spectrum. UUT self-resonance plays vital role in occurrence of disturbance in random vibration profile. The stabilization of phase noise performance during dynamic (random) vibration condition is achieved by following methodologies, i.e. vibration-isolator compensation techniques, purification tactic for reference crystal of PLL, and spatial location analysis for finding out mounting position of reference crystal. Spatial analysis helps to filter out UUT self-resonance frequency from random vibration spectrum which leads to reduction of frequency resonance pickups during random vibration testing.

Keywords

g-sensitivityoven compensated crystal oscillatorphase locked loopphase noisepower spectral densityrandom vibrationreference sourcetemperature compensated crystal oscillatorunit under testvibration isolatorvoltage controlled oscillator
Type
Radar
Information
International Journal of Microwave and Wireless Technologies , Volume 13 , Issue 4 , May 2021 , pp. 335 - 343
Check for updates
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2020

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Filler, RL (1988) The acceleration sensitivity of quartz crystal oscillators: a review. IEEE Transactions on Ultrasonics, Ferroelectectrics, and Frequency Control 35, 297–305.CrossRefGoogle ScholarPubMed
Hati, A, Nelson, CW and Howe, DA (2009) Vibration-induced PM and AM noise in microwave components. IEEE Transactions on Ultrasonics, Ferroelectectrics, and Frequency Control 56, 2050–2059.CrossRefGoogle ScholarPubMed
Banerjee, D (2003) PLL Performance, Simulation, and Design, 3rd Edn. New York: John Wiley and Sons.Google Scholar
Vectron International: Temperature Compensated Crystal Oscillator Low G-Sensitivity, TX-508 datasheet, Rev: 06/2011.Google Scholar
Kosinski, JA and Ballato, A (1993) Designing for low acceleration sensitivity. IEEE Trans. Ultrasonics. Ferroelectrics. Freq. Control 40, 532–537.Google ScholarPubMed
Hati, A, Nelson, CW and Howe, DA (2009) Vibration-induced PM and AM noise in microwave components. IEEE Transactions on Ultrasonic, Ferroelectrics, and Frequency Control.CrossRefGoogle ScholarPubMed
Howe, DA, Lanfranchi, J, Cutsinger, L, Hati, A and Nelson, CW (2005) Vibration-induced PM noise in oscillators and measurements of correlation with vibration sensors. Proc. IEEE Frequency Control Symposium, pp. 494–498.CrossRefGoogle Scholar
Tustin, W (2005) Random Vibration & Shock Testing. Santa Barbara, CA: Equipment Reliability Institute.Google Scholar
Lakshminarayanan, V (2001) Environmental-stress screening improves electronic-design reliability, EDN, pp.73–84, www.ednmag.com.Google Scholar
Li, NM and Das, D: Critical Review of U.S. Military Environmental Stress Screening (ESS) Handbook, 978–1-5090-1880-2/16/$31.00 ©2016 IEEE.Google Scholar
Wallin, T, Josefsson, L and Lofter, B (2003) Phase noise performance of sapphire microwave oscillators in airborne radar systems. Proc. 7th Symposium, GigaHertz, pp. 1–4.Google Scholar
Howe, DA, Lanfranchi, J, Cutsinger, L, Hati, A and Nelson, CW (2005) Vibration-induced PM noise in oscillators and measurements of correlation with vibration sensors. Proc. 2005 IEEE Int. Frequency Control Symposium and Exposition, August, pp. 494–498.CrossRefGoogle Scholar
Walls, FL (1990) High spectral purity X-band source. Proc. 44th Freq. Contr. Symposium, May, pp. 542–548.CrossRefGoogle Scholar
Kumar, V, Jayasheela, CS, Shivakumar, R and Manjunath, R (2018) Stabilization of phase noise of PLL system under random vibration environment. 2018 IEEE MTT-S International Microwave and RF Conference (IMaRC), Kolkata, India, pp. 1–4. V.Google Scholar
Kumar, V, Jhariya, S, Jayasheela, CS Shivakumar, R and Manjunath, R (2019) Phase Noise Performance Improvement of X-Band Airborne Radar System. 2019 IEEE 5th International Conference for Convergence in Technology (I2CT), Bombay, India, pp. 1–4.Google Scholar
Kumar, V and Sarkar, M (2019) Analysis of Random Vibration Testing & Precautions for Failure Avoidance. 2019 IEEE Asia-Pacific Microwave Conference (APMC), Singapore, Singapore, pp. 880–882.Google Scholar