Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-15T21:16:20.354Z Has data issue: false hasContentIssue false
  • English
  • Français

Near-field microwave microscopy for the characterization of dielectric materials

Published online by Cambridge University Press:  02 September 2014

Jamal Rammal ,
Olivier Tantot ,
Nicolas Delhote  and
Serge Verdeyme
Jamal Rammal*
Affiliation:
XLIM UMR 6172 CNRS, 123 Avenue Albert Thomas, 87060 LimogesFrance. Phone: + 33 6 51595508
Olivier Tantot
Affiliation:
XLIM UMR 6172 CNRS, 123 Avenue Albert Thomas, 87060 LimogesFrance. Phone: + 33 6 51595508
Nicolas Delhote
Affiliation:
XLIM UMR 6172 CNRS, 123 Avenue Albert Thomas, 87060 LimogesFrance. Phone: + 33 6 51595508
Serge Verdeyme
Affiliation:
XLIM UMR 6172 CNRS, 123 Avenue Albert Thomas, 87060 LimogesFrance. Phone: + 33 6 51595508
*
Corresponding author: J. Rammal Email: [email protected]
Get access Rights & Permissions [Opens in a new window]

Abstract

In this paper, we present a near-field microwave microscopy method for the characterization of dielectric materials samples in the Industrial, Scientific and Medical (ISM) band. The system proposed is composed of a probe coupled to a dielectric resonator (DR) operating in the TE011 mode. Latter this is used to fix the resonance frequency of the resonator at 2.45 GHz. This system is used for the characterization of dielectric samples with accuracy and high spatial resolution, knowing that they do not have predetermined forms, but a small plane surface.The same device is used for a multi-frequency characterization (4–20 GHz) using resonance frequencies of the cavity instead of one resonance frequency of the DR.

Keywords

CharacterizationNear-fieldDielectric resonatorDielectric materialsMulti-frequency
Type
Research Papers
Information
International Journal of Microwave and Wireless Technologies , Volume 6 , Special Issue 6: Mediterranean Microwave Symposium 2013 , December 2014 , pp. 549 - 554
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2014 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Wee, F.H. et al. : Free space measurement technique on dielectric properties of agricultural residues at microwave frequencies, in Microwave and Optoelectronics Conf. (IMOC), 2009SBMO/IEEE MTT-S Int.CrossRefGoogle Scholar
[2] Janezic, M.D.; Barker-Jarvis, J.: Full-wave analysis of a split-cylinder resonator for nondestructive permittivity measurements. IEEE MTT, 47 (10) (1999), 2014–2020.CrossRefGoogle Scholar
[3]85072A 10-GHZ Split Cylinder Resonator, Agilent Technologies, Tech. Product Note, Feb. 2008.Google Scholar
[4] Yue, H.; Virga, K.; Prince, J.: Dielectric constant and loss tangent measurement using a stripline fixture. IEEE Trans. Compon., Packag., Manuf. Technol. B, Adv. Packag., 21 (4) (1998), 441–446.CrossRefGoogle Scholar
[5] Boybay, M.S.; Ramahi, O.M.: Material characterization using complementary split-ring resonators. IEEE Trans. Instrum. Meas., 61 (2012), 3039–3046.CrossRefGoogle Scholar
[6] Farina, M. et al. : High resolution scanning microwave microscopy for applications in liquid environment. IEEE Microw. Wirel. Compon. Lett., 22 (2012), 595–597.CrossRefGoogle Scholar
[7] Tabib-Azar, M. et al. : Design and fabrication of scanning near-field microwave probes compatible with atomic force microscopy to image embedded nanostructures. IEEE Trans. Microw. Theory, 52 (3) (2004), 971–979.CrossRefGoogle Scholar
[8] Monti, T. et al. : Etching by a near-field scanning microwave microscope, in Microwave Symp. Digest (IMS), 2013 IEEE MTT-S Int.CrossRefGoogle Scholar
[9] Talanov, V.V.; Scherz, A.; Moreland, R.L.; Schwartz, A.R.: A near field scanned microwave probe for spatially localised electrical metrology. Appl. Phys. Lett., 88 (2006), 134106.CrossRefGoogle Scholar
[10] Monti, T. et al. : Liquids characterization using a dielectric resonator-based microwave probe, in 42nd European Microwave Conf. (EuMC), Amesterdam, 2012.Google Scholar
[11] Vlahacos, C.P.; Steinhauer, D.E.; Anlage, S.M.; Wellstood, F.C.; Dutta, S.K.; Feenstra, J.B.: Non-contact imaging of dielectric constant with a near-field scanning microwave microscope, In The Americas Microscopy and Analysis, January 2000, pp. 5–7.Google Scholar
[12] Barker, D.J.; Suherman, P.M.; Jackson, T.J.; Lancaster, M.J.: Comparison of scanning evanescent microwave microscopy with co-planar waveguide methods of characterization of Ba0.5Sr0.5TiO3 thin films. ISAF 2009, in Proc. of the 18th IEEE Int. Symp. on Applications of Ferroelectrics.Google Scholar
[13] Gao, C. et al. : Quantitative scanning evanescent microwave microscopy and its applications in characterization of functional materials libraries. Meas. Sci. Technol., 16 (2005), 248–260.CrossRefGoogle Scholar
[14] Kim, M.S. et al. : Tip sample distance control for near-field scanning microwave microscopes. Rev. Sci. Instrum., 74 (2003), 3675.CrossRefGoogle Scholar
[15] Alaaeddine, H. et al. : Resonance of stacked rings in LTCC technology for non-destructive characterisation sensor at 150 GHz, in 42nd European Microwave Conf., Amesterdam, 2012, pp. 109–111.CrossRefGoogle Scholar
[16] Haase, N.; Jacob, A.F.: Resonant substrate-integrated near-field sensors with improved sensitivity, in 42nd European Microwave Conf., Nuremberg, Germany, 2013, pp. 1439–1442.Google Scholar