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The accurate comparison (or calibration) of solid-state noise sources made simple

Published online by Cambridge University Press:  17 July 2014

René P. Meys*
Affiliation:
Université Libre de Bruxelles, B-1050 Bruxelles, Belgium. Phone: +32 26 503 062
Fayçal Boukerroum
Affiliation:
NDT Laboratory, Jijel University, Jijel, Algeria
*
Corresponding author: René P. Meys Email: [email protected]

Abstract

The accurate comparison (or calibration) of conventional solid-state noise sources is often thought to be a difficult process that only specialized laboratories can perform. In this paper, the uncertainties due to the impedance differences between the sources and their on and off states are emphasized and a simple formula is developed that makes them negligible. It requires an isolator being used in front of the receiver. In the experimental section, the errors associated with common practice are evidenced and compared to what can be achieved through the correction formula.

Type
Research Paper
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2014 

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References

REFERENCES

[1]Pozar, D.M.: Microwave and RF Design of Wireless Systems, Wiley, New York, 2001, pp. 89, 88, 196, 92, 95.Google Scholar
[2]Agilent Technologies Inc.: Agilent noise source calibration using the Agilent N8975A noise figure analyzer and the N2002A noise source test set, Santa Clara, California, 2007. Available at: http://cp.literature.agilent.com/litweb/pdf/5988-7229EN.pdfGoogle Scholar
[3]Agilent Technologies Inc.: Noise figure measurement accuracy –The y-factor method, Santa Clara, California, 2004. Available at: http://cp.literature.agilent.com/litweb/pdf/5952-3706E.pdfGoogle Scholar
[4]Agilent Technologies Inc.: Agilent 8757D scalar network analyzer, Santa Clara, California, 2005. Available at: http://cp.literature.agilent.com/litweb/pdf/5091-2471E.pdfGoogle Scholar
[5]Williams, G.L.: A broadband radiometer for calibrating mismatched noise sources. IEEE Trans. Instrum. Meas., 40 (2) (1991), 443445.Google Scholar
[6]Williams, G.L.: Measuring amplifier noise on a noise source calibration radiometer. IEEE Trans. Instrum. Meas., 44 (2) (1995), 340442.Google Scholar
[7]Wait, D.F.: Radiometer noise equation for noise comparison radiometer. IEEE Trans. Instrum. Meas., 44 (2) (1995), 336339.Google Scholar
[8]Randa, J.; Terrell, L.A.: Noise-temperature measurement system for the WR-28 band, Natl. Inst. Stand. Technol., Boulder, Colorado, Tech. Note 1395, 1997. Available at: http://ts.nist.gov/MeasurementServices/Calibrations/upload/TN1395.pdfGoogle Scholar
[9]Grosvenor, C.A.; Randa, J.; Billinger, R.L.: Design and testing of NFRad – A new noise measurement system, Natl. Inst. Stand. Technol., Boulder, Colorado, Tech. Note 1518, March 2000. Available at: http://ts.nist.gov/MeasurementServices/Calibrations/upload/TN1518.pdfGoogle Scholar
[10]Randa, J.: Noise measurements and remote-sensing radiometry (at NIST), in The Int. Conf. Measurement and Metrology, ICMM-2007, Beijing, China, 2007.Google Scholar