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RF wave visions for circuit analyses and diagnoses by live electrooptic imaging camera

Published online by Cambridge University Press:  01 July 2010

Masahiro Tsuchiya  and
Takahiro Shiozawa
Masahiro Tsuchiya*
Affiliation:
National Institute of Information and Communications Technology, 4-2-1 Nukui-Kitamachi, Koganei, Tokyo 184-8795, Japan.
Takahiro Shiozawa
Affiliation:
Kagawa National College of Technology, 551 Kohda, Takuma, Mitoyo, Kagawa 769-1192, Japan.
*
Corresponding author: M. Tsuchiya Email: [email protected]
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Abstract

A novel scheme involving experimental analyses and diagnoses is presented for monitoring radio-frequency (RF) and high-speed circuits. A live electrooptic imaging (LEI) camera is used in the scheme and it provides real-time images of the phase evolution of the RF electric field. Besides, it is demonstrated that essential properties of RF wave propagation are easily grasped from visual images; examples of LEI movies and images from which such essential properties can be identified are presented. The subjects of the LEI observations, analyses, and diagnoses are planar RF circuits and a Gbps-class emitter-coupled-logic circuit. In addition, the results of analyses and diagnoses in the space domain are discussed.

Keywords

Electrooptic effectsImage analysisImage sensorPropagationReal-time systemsMicrowave measurements
Type
Original Article
Information
International Journal of Microwave and Wireless Technologies , Volume 2 , Special Issue 3-4: European Microwave Week 2009 , August 2010 , pp. 341 - 347
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2010

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References

REFERENCES

[1]Yang, K.; David, G.; Took, J.-G.; Papapolymerou, I.; Katehi, L.P.B.; Whitaker, J.F.: Electrooptic mapping and finite-element modeling of the near-filed pattern of a microstrip patch antenna. IEEE Trans. Microw. Theory Tech., 48 (2000), 288–293.CrossRefGoogle Scholar
[2]Yamazaki, E.; Wakana, S.; Park, H.; Kishi, M.; Tsuchiya, M.: High-frequency magneto-optic probe based on BiRIG rotation magnetization. IEICE Trans. Electron., E86-C (2003), 1338–1344.Google Scholar
[3]Sasagawa, K.; Kanno, A.; Kawanishi, T.; Tsuchiya, M.: Live electro-optic imaging system based on ultra-parallel photonic heterodyne for microwave near-fields. IEEE Trans. Microw. Theory Tech., 55 (2007), 2782–2791.CrossRefGoogle Scholar
[4]Sasagawa, K.; Kanno, A.; Kawanishi, T.; Tsuchiya, M.: Live electro-optic imaging of microwave near-fields via ultra-parallel photonic heterodyne, in Proc. Int. Microw. Symp. 2007 (IMS2007), Honolulu, USA, 3–8 June 2007, 401–404.Google Scholar
[5]Sasagawa, K.; Tsuchiya, M.: Real-time monitoring system of RF near-field distribution images on the basis of 64-channel parallel electro-optic data acquisition. IEICE Electron. Express, 2 (2005), 600–606.CrossRefGoogle Scholar
[6]Sasagawa, K.; Kanno, A.; Tsuchiya, M.: Real-time digital signal processing for live electro-optic imaging. Opt. Express, 17 (2009), 15641–15651.CrossRefGoogle ScholarPubMed
[7]Tsuchiya, M.; Kanno, A.; Sasagawa, K.; Shiozawa, T.: Image and/or movie analyses of 100-GHz traveling waves on the basis of real-time observation with a live electrooptic imaging camera. IEEE Trans. Microw. Theory Tech., 57 (2009), 3373–3379.CrossRefGoogle Scholar
[8]Tsuchiya, M.; Kanno, A.; Sasagawa, K.; Shiozawa, T.: Phase-evolving real-time visualization of 100 GHz travelling waves, in Proc. Int. Microw. Symp. 2009 (IMS2009), Boston, USA, June 7–12, 2009, 1673–1676.Google Scholar
[9]Kanno, A.; Sasagawa, K.; Tsuchiya, M.: Phase-resolved visualization of 100 GHz travelling electromagnetic waves by an EO imaging method, in Proc. LEOS 2008 Annual Meeting, Newport Beach, USA, November 9–13, 2008, 218–219.CrossRefGoogle Scholar
[10]Kanno, A.; Sasagawa, K.; Tsuchiya, M.: W-band live electro-optic imaging system, in Proc. 38th European Microwave Conf. (EuMC2008), Amsterdam, The Netherlands, October 27–31, 2008, 369–372.CrossRefGoogle Scholar
[11]Valdmanis, J.A.; Mourou, G.; Gabel, C.W.: Picosecond electro-optic sampling system. Appl. Phys. Lett., 41 (1982), 211–212.CrossRefGoogle Scholar
[12]Valdmanis, J.A.; Mourou, G.: Subpicosecond electrooptic sampling: Principles and applications. IEEE J. Quantum Electron., QE-22 (1986), 69–78.CrossRefGoogle Scholar
[13]Nagatsuma, T.; Shinagawa, M.; Sahri, N.; Sasaki, A.; Royter, Y.; Hirata, A.: 1.55-µm photonic systems for microwave and millimetre-wave measurement. IEEE Trans. Microw. Theory Tech., 49 (2001), 1831–1839.CrossRefGoogle Scholar
[14]Pockels, F.: Lehrbuch der Kristalloptik, Leipzig: Teubner, 1906.Google Scholar
[15]Kaminow, I.P.; Turner, R.H.: Electrooptic light modulators. Proc. IEEE, 54 (1966), 1374–1390.CrossRefGoogle Scholar
[16]Sasagawa, K.; Kanno, A.; Tsuchiya, M.: Real-time digital signal processing for live electro-optic imaging. Opt. Express 17 (2009), 15641–15651.CrossRefGoogle ScholarPubMed
[17]Tsuchiya, M.; Sasagawa, K.; Shiozawa, T.: Real-time observations and analyses of RF wave propagations by live electrooptic imaging camera, in Proc. European Microwave Conf., Roma, Italy, September 28–October 3, 2009, 787–790.CrossRefGoogle Scholar
[18]http://lei-camera.nict.go.jp/movies_lib/movie_lib1.htmlGoogle Scholar
[19]http://lei-camera.nict.go.jp/movies_lib/movie_lib36.htmlGoogle Scholar
[20]http://lei-camera.nict.go.jp/movies_lib/movie_lib32.htmlGoogle Scholar
[21]http://lei-camera.nict.go.jp/movies_lib/movie_lib33.htmlGoogle Scholar
[22]http://lei-camera.nict.go.jp/movies_lib/movie_lib34.htmlGoogle Scholar
[23]Tsuchiya, M.; Shiozawa, T.: Visual observation of internal signal transmissions in a millimeter-wave amplifier module. Accepted for presentation in European Microwave Conf., Paris, France, September 26–October 1, 2010.Google Scholar