A new methodology for optimal RF DFT sensor design
Published online by Cambridge University Press: 03 July 2012
Abstract
In this paper, a new methodology to compare the robustness of sensor structures employed in radiofrequency design for test (RF DFT) architectures for RF integrated circuits (ICs) is proposed. First, the yield loss and defect level of the test technique is evaluated using a statistical model of the Circuit under Test (obtained through non-parametric statistics and copula theory). Then, by carrying out the dispersion analysis of the sensor architecture, a figure of merit is established. This methodology reduces the number of iterations in the design flow of RF DFT sensors and makes it possible to evaluate process dispersion. The case study is a SiGe:C BiCMOS LNA tested by a single-probe measurement.
Keywords
- Type
- Research Papers
- Information
- International Journal of Microwave and Wireless Technologies , Volume 4 , Issue 5 , October 2012 , pp. 515 - 521
- Copyright
- Copyright © Cambridge University Press and the European Microwave Association 2012
References
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