Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-25T03:45:03.570Z Has data issue: false hasContentIssue false
  • English
  • Français

An improved quadratic poly-harmonic distortion behavioral model

Published online by Cambridge University Press:  28 August 2014

Jialin Cai ,
Justin B. King  and
Tom J. Brazil
Jialin Cai*
Affiliation:
School of Electrical, Electronic and Communication Engineering, University College Dublin, Dublin, Ireland, Phone: +353 87 1655 869
Justin B. King
Affiliation:
School of Electrical, Electronic and Communication Engineering, University College Dublin, Dublin, Ireland, Phone: +353 87 1655 869
Tom J. Brazil
Affiliation:
School of Electrical, Electronic and Communication Engineering, University College Dublin, Dublin, Ireland, Phone: +353 87 1655 869
*
Corresponding author: J. Cai Email: [email protected]
Get access Rights & Permissions [Opens in a new window]

Abstract

In this paper, the basic quadratic form of the poly-harmonic distortion model is first presented and this is then extended to provide a new, modified quadratic poly-harmonic distortion model. Comparisons between the X-parameter model, the basic quadratic poly-harmonic distortion model, and the modified version are provided. Both simulation and experimental test results show that the new modified model provides significant improvements in accuracy, not only for the fundamental frequency, but also for DC. Work on the optimization of the model is also presented, providing further improvements in both the model extraction time and the file size.

Keywords

Linear and nonlinear CAD techniquesModelingsimulation and characterizations of device and circuits
Type
Research Paper
Information
International Journal of Microwave and Wireless Technologies , Volume 7 , Issue 6 , December 2015 , pp. 605 - 613
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2014 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1]David, V.: Fundamentally changing nonlinear microwave design. Microw. J., 53 (3) (2010), 22–38.Google Scholar
[2]Charles, B.; Robert, M. II; Josh, M.; Hunter, M.; Matthew, M.: Going nonlinear. IEEE Microw. Mag., 12 (2) (2011), 55–64.Google Scholar
[3]Michael, H.: Get on the same nonlinear page. IEEE Microw. Mag., 12 (2) (2011), 32–37.Google Scholar
[4]Jan, V.; Denis, B.; Jean-Pierre, T.; Jean-Michel, N.: Hot S-parameters techniques: 6 = 4 + 2, in 66th ARFTG Conf., Washington, USA, 2005.Google Scholar
[5]Jan, V.; David, E.R.: Poly harmonic distortion modeling. IEEE Microw. Mag., 7 (3) (2006), 44–57.Google Scholar
[6]David, E.R.; Jan, V.: Broad-band poly-harmonic distortion (PHD) behavioral models from fast automated simulations and large-signal Vectorial network measurements. IEEE Trans. Microw. Theory Tech., 53 (11) (2005), 3656–3664.Google Scholar
[7]Jan, V.; Gunyan, D.; Horn, J.; Xu, J.; Cognata, A.; David, E.R.: Multi-tone, multi-port, and dynamic memory enhancements to PHD nonlinear behavioral models from large-signal measurements and simulations, in IEEE MTT-S Int. Microwave Symp., Honolulu, HI, USA, 2007, 969–972.Google Scholar
[8]Verspecht, J.; Williams, D.F.; Schreurs, D.; Remley, K.A.; McKinley, M.D.: Linearization of large-signal scattering functions. IEEE Trans. Microw. Theory Tech., 53 (4) (2005), 1365–1376.Google Scholar
[9]Simpson, G. et al. : Load-pull + NVNA = Enhanced X-parameters for PA designs with high mismatch and technology-independent large-signal device models, in IEEE ARFTG Conf., Portland, OR, USA, 2008, 88–91.Google Scholar
[10]Horn, J.; Root, D.E.; Simpson, G.: GaN device modeling with X-parameters, in IEEE Computer Semiconductor Integrated Circuit Symp., 2010, 1–4.Google Scholar
[11]Dylan, B.; Boumaiza, S.: X-parameter measurements challenges for unmatched device characterization, in Microwave Measurements Conf. (75th ARFTG), 2010, 1–4.Google Scholar
[12]Hao, Q.; Johannes, B.; Paul, J.T.: Nonlinear data utilization: from direct data lookup to behavioral modeling. IEEE Trans. Microw. Theory Tech., 57 (6) (2009), 1425–1432.Google Scholar
[13]Simon, P.W.; Saini, R.; Williams, D.; Lees, J.; Benedikt, J.; Tasker, P.J.: Behavioral model analysis of active harmonic load-pull measurements, in IEEE MTT-S Int. Microwave Symp, Anaheim, CA, USA, 2010, 1688–1691.Google Scholar
[14]Simon, P.W.: Behavioral model analysis of active harmonic load-pull measurements, Ph.D. dissertation, Dept. Elect. Eng, Cardiff University, UK, 2010.Google Scholar
[15]Verspecht, J.: Everything you've always wanted to know about Hot-S22 (but we're afraid to ask), in Workshop in Int. Microwave Symp., 2002.Google Scholar
[16]Qinglong, Z.; Shengli, L.: Comparative study of X-parameters and nonlinear scattering functions, in The 10th Int. Conf. Electronic Measurement and Instruments (ICEMI), Chengdu, China, 2011, vol. 3, 355–358.Google Scholar
[17]Advanced Design System Documentation. http://agilent.com.Google Scholar
[18]Verspecht, J.; Root, D.E.; Wood, J.; Cognata, A.: Broad-band multi-harmonic frequency domain behavioral models from automated large-signal vectorial network measurements, in IEEE MTT-S Int. Microwave Symp., Long Beach, CA, USA, 2005, 1975–1978.Google Scholar