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Simultaneous Scatterer Shape Estimation and Partial Aperture Far-Field Pattern Denoising

Published online by Cambridge University Press:  20 August 2015

Yaakov Olshansky  and
Eli Turkel
Yaakov Olshansky*
Affiliation:
Applied Mathematics, Tel-Aviv University, Israel
Eli Turkel*
Affiliation:
Applied Mathematics, Tel-Aviv University, Israel
*
Corresponding author.Email:[email protected]
Email address:[email protected]
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Abstract

We study the inverse problem of recovering the scatterer shape from the far-field pattern(FFP) in the presence of noise. Furthermore, only a discrete partial aperture is usually known. This problem is ill-posed and is frequently addressed using regularization. Instead, we propose to use a direct approach denoising the FFP using a filtering technique. The effectiveness of the technique is studied on a scatterer with the shape of the ellipse with a tower. The forward scattering problem is solved using the finite element method (FEM). The numerical FFP is additionally corrupted by Gaussian noise. The shape parameters are found based on a least-square error estimator. If ũ∞ is a perturbation of the FFP then we attempt to find Γ, the scatterer shape, which minimizes ∣∣ũ∞ − ũ∞∣∣ using the conjugate gradient method for the denoised FFP

Keywords

81U40Scattering inverse problemfar field pattern
Type
Research Article
Information
Communications in Computational Physics , Volume 11 , Issue 2 , February 2012 , pp. 271 - 284
Copyright
Copyright © Global Science Press Limited 2012

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