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Novel method for transmission infrared analysis of clay minerals using silicon wafer substrates

Published online by Cambridge University Press:  01 January 2024

Jeffrey A. Caulfield ,
Todd A. Wells  and
Keith E. Miller
Jeffrey A. Caulfield
Affiliation:
Department of Chemistry and Biochemistry, University of Denver, 2190 East Iliff Ave., Denver, Colorado 80208, USA
Todd A. Wells
Affiliation:
Department of Chemistry and Biochemistry, University of Denver, 2190 East Iliff Ave., Denver, Colorado 80208, USA
Keith E. Miller*
Affiliation:
Department of Chemistry and Biochemistry, University of Denver, 2190 East Iliff Ave., Denver, Colorado 80208, USA
*
*E-mail address of corresponding author: [email protected]
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Abstract

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A novel method for the analysis of clay minerals using Fourier transform infrared spectroscopy is presented. Clay mineral suspensions are dried on a Si wafer substrate for transmission infrared (IR) analysis. Four natural Source Clays from the Source Clays Repository of The Clay Minerals Society, SWy-2, SAz-1, SHCa-1 and KGa-1b, as well as the synthetic hectorite, Laponite RD, were analyzed using the described method with signal to noise (s/n) ratios in excess of 100,000 for the strongly absorbing Si-O stretching frequency. Scanning electron microscopy (SEM) images show that the mineral films possess suitable uniformity and low surface roughness for transmission IR measurements that is confirmed by minimal deviations in the baseline of collected IR spectra. The IR spectra are generated and peak locations are compared to previously reported values, generated from KBr pellet and attenuated total reflectance methods.

Keywords

FTIRLaponiteSilicon WaferSource ClaysWafer Substrate
Type
Research Article
Information
Clays and Clay Minerals , Volume 55 , Issue 2 , April 2007 , pp. 213 - 219
Copyright
Copyright © 2007, The Clay Minerals Society

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