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High-Resolution Particle Size Analysis from Nanometres to Microns

Published online by Cambridge University Press:  09 July 2018

P. McFadyen  and
D. Fairhurst
P. McFadyen
Affiliation:
Brookhaven Instruments Ltd., Chapel House, Stock Wood, Worcestershire B96 6ST, UK
D. Fairhurst
Affiliation:
Brookhaven Instruments Corporation, Holtsville, New York 11742, USA
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Abstract

Modem disc centrifuge technology has extended the range of application of sedimentation particle size analysis to include the submicron region. An overall size range of approximately 10 nm to 100 pm is now accessible. The principles of both the disc centrifuge photosedimentometer, which employs optical detection with full Mie light scattering corrections, and the X-ray disc centrifuge are described. Examples of their application to a variety of samples are given to illustrate the performance characteristics of the instruments including a direct comparison of resolving power with that of the laser diffraction technique.

Type
Research Article
Information
Clay Minerals , Volume 28 , Issue 4 , December 1993 , pp. 531 - 537
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1993

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