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THE ULTRA STRUCTURE OF INSECT SURFACES BY SCANNING ELECTRON MICROSCOPY

Published online by Cambridge University Press:  31 May 2012

E. H. Salkeld  and
A. Wilkes
E. H. Salkeld
Affiliation:
Entomology Research Institute, Canada Department of Agriculture, Ottawa
A. Wilkes
Affiliation:
Entomology Research Institute, Canada Department of Agriculture, Ottawa
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Extract

A recent development in microscopy certain to be of great interest to entomologists is the Scanning Electron Microscope. This machine overcomes the difficulties of studying solid surfaces with a standard light microscope and the problems of the extremely small limits of penetration of the electron microscope. This new microscope focuses a stream of electrons into a beam as small as 1 μ in diameter which moves over the surface of the specimen in a regular pattern, causing secondary radiations to emerge from the surface of the specimen. These are collected by a very sensitive detector and converted to an image similar to that produced by a television tube.

Type
Articles
Information
The Canadian Entomologist , Volume 100 , Issue 1 , January 1968 , pp. 1 - 4
Copyright
Copyright © Entomological Society of Canada 1968

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