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Xrf With Tunable Monochromatic Excitation and Variation of the Incidence Angle

Published online by Cambridge University Press:  06 March 2019

Horst Ebel ,
Maria F. Ebel ,
Robert Svagera ,
Norbert Wirth ,
Roland Kaitna  and
Hartinut Schandl
Horst Ebel
Affiliation:
Technische Universität Wien Institut für Angewandte und Technische Physik Wiedner Hauptstraβe 8-10, A 1040 Vienna, AUSTRIA
Maria F. Ebel
Affiliation:
Technische Universität Wien Institut für Angewandte und Technische Physik Wiedner Hauptstraβe 8-10, A 1040 Vienna, AUSTRIA
Robert Svagera
Affiliation:
Technische Universität Wien Institut für Angewandte und Technische Physik Wiedner Hauptstraβe 8-10, A 1040 Vienna, AUSTRIA
Norbert Wirth
Affiliation:
Technische Universität Wien Institut für Angewandte und Technische Physik Wiedner Hauptstraβe 8-10, A 1040 Vienna, AUSTRIA
Roland Kaitna
Affiliation:
Rokappa Laborinstrumente Krichbaumgasse 31, A 1120 Vienna, AUSTRIA
Hartinut Schandl
Affiliation:
Rokappa Laborinstrumente Krichbaumgasse 31, A 1120 Vienna, AUSTRIA
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Extract

The x-ray source of our instrument is a rotating anode system with a silver target. It is flanged to a He-filled monochromator chamber. The photon energy of the x-rays for the excitation of characteristic specimen radiation can be tuned continuously from IkeV to 30 keV. The cross-section of the beam - monochromatic or polychromatic tube radiation - leaving the monochromator chamber is variable within 0.1 and 100mm2. A Be-window separates the evacuable specimen chamber from the monochromator chamber. The specimen holder allows for a linear movement of the specimen in x- and y-direction normal to the beam of incident x-radiation and allows a laterally resolved analysis. A rotation around an axis normal to the incident x-ray beam enables investigations under variable incidence- and take-off angles. X-ray detection is performed by an energy dispersive system.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 619 - 627
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

1. Criss, J. W. and Birks, L.S., Anal.Chem. 40: 1080, (1968)Google Scholar
2. Mantlet, M., Prog.Crystal Growth and Charact. 14: 213, (1987)Google Scholar
3. Ebel, M. F.,Ebel, H.,Svagera, R.,Heller, M.,Wernisch, J.,and R., Kaitna, X-Ray Spectrometry 22: 300, (1993)Google Scholar
4. Pella, P. A.,Feng, L. Y.,and Small, J.A., X-Ray Spectrometry 14: 125, (1985),Google Scholar
5. Ebel, H.,Wiederschwinger, H.,Wernisch, J.,and Pella, P.A., Adv.in X-Ray Analysis 35: 721, (1992)Google Scholar
6. Ebel, M. F.,and W., Liebl, J.Electron Spectrosc.Relat.Phenomena 16: 463, (1970) .Google Scholar
7. Sherman, J., Spectrochim.Acta 7: 283, (1955).Google Scholar
8. McMaster, W. H.,del Grande, N.K., Mallett, J. H., and Hubbell, J.H., Compilation of X-Ray Cross-Sections, UCRL-50174, Sect. II, Rev.1.Lawrence Radiation Laboratory, University of California, Livermore, CA (1969)Google Scholar