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X-Ray Residual Stress Mapping in Industrial Materials By Energy Dispersive Diffractometry

Published online by Cambridge University Press:  06 March 2019

C. J. Bechtoldt ,
R. C. Placious ,
W. J. Boettinger  and
M. Kuriyama
C. J. Bechtoldt
Affiliation:
National Bureau of Standards Washington, D.C. 20234
R. C. Placious
Affiliation:
National Bureau of Standards Washington, D.C. 20234
W. J. Boettinger
Affiliation:
National Bureau of Standards Washington, D.C. 20234
M. Kuriyama
Affiliation:
National Bureau of Standards Washington, D.C. 20234
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Abstract

An application of energy dispersive diffractometry to the measurement of residual strains (stresses) in the interior of industrial materials is described with particular emphasis on the use of high energy (up to 250 keV) x-ray photons. The use of high energy photons permits better penetration into materials. Hence diffraction data for evaluating bulk residual strains can be obtained in the transmission geometry in contrast with the conventional angular dispersive diffractometry, which uses Bragg reflections from the surface of materials. The reliability and sensitivity (detectability of small strains) of the energy dispersive method are demonstrated through its application to mapping of residual stress distributions across weld zones in Alaskan pipe line segments (API5LX65). The detectability of strain variations within materials depends on x-ray optical resolution and statistics.

Type
VIII. XRD Applications
Information
Advances in X-Ray Analysis , Volume 25: Thirtieth Annual Conference on Applications of X-ray Analysis, August 3-7, 1981 , 1981 , pp. 329 - 338
Copyright
Copyright © International Centre for Diffraction Data 1981

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References

1. Cohen, J. B., H. Dölle and James, M. E., Proceedings of Symposium on Accuracy in Powder Diffraction in : “NBS Special Publ. 567,” p. 453 (1980).Google Scholar
2. Giessen, B. C. and Gordon, G.E., Science 159 973 (1968).Google Scholar
3. Leonard, L., “Franklin Institute Research Lab Report F-C3454,” Philadelphia, July (1973).Google Scholar
4. Kuriyama, M., Boettinger, W.J. and Burdette, H.E., ASNT National Fall Conference, p. 49 (1978), October, Denver, CO.Google Scholar
5. Kuriyama, M., Boettinger, W.J. and Burdette, H.E., Proceedings of Symposium on Accuracy in Powder Diffraction, “NBS Special Publ. 567,” p. 479 (1980).Google Scholar
6. Kuriyama, M., Proc. of Synposium on Nondestructive Measure of Wheel/Axle Residual Stress, Dept. of Transportation, (1981). In print.Google Scholar
7. Laine, E., Lahteenmaki, I. and Kantola, M., X-Ray Spectrometry, 193 (1972).Google Scholar
8. Kukamachi, T., Rosoya, S. and Terasaki, D., J. Appl. Cryst. 6 117 (1973).Google Scholar