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X-Ray Microprobe Studies Using Multilayer Focussing Optics

Published online by Cambridge University Press:  06 March 2019

A.C. Thompson ,
J.H. Underwood ,
Y. Wu ,
R.D. Giauque ,
M.L. Rivers  and
R. Futernick
A.C. Thompson
Affiliation:
Lawrence Berkeley Laboratory, Berkeley, CA 94720
J.H. Underwood
Affiliation:
Lawrence Berkeley Laboratory, Berkeley, CA 94720
Y. Wu
Affiliation:
Lawrence Berkeley Laboratory, Berkeley, CA 94720
R.D. Giauque
Affiliation:
Lawrence Berkeley Laboratory, Berkeley, CA 94720
M.L. Rivers
Affiliation:
University of Chicago, Chicago, IL 60637
R. Futernick
Affiliation:
Fine Arts Museum, San Francisco, CA 94121
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Extract

The availability of intense x-rays from synchrotron radiation sources permits the elemental analysis of samples in new ways. An x-ray microprobs using these sources allows the analysis of much smaller samples with greatly improved elemental sensitivity. In addition to the higher x-ray intensity obtained at synchrotron sources, the development of high efficiency x-ray reflectors using multilayer coated optical mirrors permits the achievement of spot sizes of less than 10 μm x 10 μm with enough x-ray intensity to simultaneously measure femtogram quantities of many elements in less than one minute. Since samples to be studied in an x-ray microprobe do not have to be placed in a vacuum, almost any sample can be conveniently analyzed. With an x-ray microprobe it is possible to obtain elemental distributions of elements in one, two or even three dimensions.

Type
IV. Techniques and XRF Instrumentation
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 149 - 153
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

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