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X-Ray Diffractometric Examination of Low-Temperature Phase Transformations in Single-Crystal Strontium Titanate

Published online by Cambridge University Press:  06 March 2019

Farrel W. Lytle
Farrel W. Lytle*
Affiliation:
Boeing Scientific Research Laboratories Seattle, Washington
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Abstract

The lattice parameters of single-crystal SrTiO2 were determined by X-ray diffraction as a function of temperature from 4.2 to 300°K. Three significant regions were found: from 65 to 110°K a tetragonal modification, exists (c/a = 1.00056); from 35 to 55°K, line splitting consistent with orthorhornbic symmetry was observed, and at 10°K an anomalous maximum in the lattice parameter vs. temperature curve was found which suggested a third structure transformation. In the tetragonal region (at 78°K) the formation of a domain structure was observed with a polarising microscope. The low-temperature X-ray technique and X-ray cryostat are described.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 7: Twelfth Annual Conference on Applications of X-ray Analysis, August 7-9, 1963 , 1963 , pp. 136 - 145
Copyright
Copyright © International Centre for Diffraction Data 1963

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References

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