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X-ray Diffractometric Determination of Lattice Misfit Between γ and γ' Phases in Ni-Base Superalloys

Conventional X-ray Source vs. Synchrotron Radiation

Published online by Cambridge University Press:  06 March 2019

Katsumi Ohno ,
Hirosi Harada ,
Toshihiro Yamagata ,
Michio Yamazaki  and
Kazumasa Ohsumi
Katsumi Ohno
Affiliation:
National Research Institute for Metals, 2-3-12 Nakaraeguro Meguro-ku, Tokyo, 153, Japan
Hirosi Harada
Affiliation:
National Research Institute for Metals, 2-3-12 Nakaraeguro Meguro-ku, Tokyo, 153, Japan
Toshihiro Yamagata
Affiliation:
National Research Institute for Metals, 2-3-12 Nakaraeguro Meguro-ku, Tokyo, 153, Japan
Michio Yamazaki
Affiliation:
National Research Institute for Metals, 2-3-12 Nakaraeguro Meguro-ku, Tokyo, 153, Japan
Kazumasa Ohsumi
Affiliation:
National Laboratory for High. Energy Physics 1-1, Oho Tsukuba-shi Iharagi-ken 305, Japan
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Abstract

The lattice misfits between γ and γ' phases in Ni-base superalloys (single crystal) were accurately determined for filings of specimens by using both a conventional X-ray tube focusing diffractometer(CXRFD) and a synchrotron-radiation parallel beam X-ray diffractometer (SRPXRD). All reflection peaks measured with the CXRFD were in a cluster of overlapping peaks because of the very small differences in the lattice parameters of both phases and the instrumental broadening due to X-ray optics including the spectral distribution of Xray source such as CuKα doublet. The deconvolution method was applied to remove the instrumental broadening from the peaks measured with the CXRFD. The window functions for the deconvolution method were calculated from CuKα doublet reflection of Si standard by a nonlinear least-square method.

The instrumental broadening of SRPXRD was much smaller than that of CXRFD since the monochromatic X-rays produced single peak profiles and constant profile shape over a wide 2θ range. A profile fitting with a pseudo-Voigt function was used to determine 2θ angles to 0.0005 deg. for the synchrotron powder data. The peak angle and shape reflected from γ' phases in γ-matrix and those fron electrochemically extracted γ'-phase were significantly different.

Type
VII. X-Ray Stress Analysis
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 365 - 375
Copyright
Copyright © International Centre for Diffraction Data 1988

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