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X-Ray Diffraction Quantitative Analysis Using Intensity Ratios and External Standards

Published online by Cambridge University Press:  06 March 2019

Raymond P. Goehner
Raymond P. Goehner*
Affiliation:
General Electric Company Corporate Research and Development Schenectady, N. Y.
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Extract

The use of quantitative x-ray diffraction (XRD) as an analytical technique has recently become increasingly popular. There ate primarily two reasons for this increasing interest in a relatively old discipline. The first is simply the need for quantitative phase analysis. This need arises from several sources such as government regulations on respiratory quartz, industrial quality control, and material research. X-ray diffraction provides a readily available technique for bulk phase analysis on chemically similiar phases. For phases which are elementally distinct, our sister science, x-ray fluorescence, can more easily provide the quantitation needed. The second reason for the increasing interest in quantitative XRD is the ready availability of automated powder diffractometers. These instruments remove much of the tedium involved in the collection and reduction of the data.

Type
VII. XRD Methods and Instrumentation
Information
Advances in X-Ray Analysis , Volume 25: Thirtieth Annual Conference on Applications of X-ray Analysis, August 3-7, 1981 , 1981 , pp. 309 - 313
Copyright
Copyright © International Centre for Diffraction Data 1981

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References

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