Hostname: page-component-745bb68f8f-cphqk Total loading time: 0 Render date: 2025-02-04T17:59:12.253Z Has data issue: false hasContentIssue false
  • English
  • Français

X-ray Diffraction Analysis of High Tc Superconducting Thin Films

Published online by Cambridge University Press:  06 March 2019

T. C. Huang ,
A. Segmuller ,
W. Lee ,
V. Lee ,
D. Bullock  and
R. Karimi
T. C. Huang
Affiliation:
IBM Research Division, Almaden Research Center 650 Harry Road, San Jose, CA 95120-6099
A. Segmuller
Affiliation:
IBM Research Division, Almaden Research Center 650 Harry Road, San Jose, CA 95120-6099
W. Lee
Affiliation:
IBM Research Division, Almaden Research Center 650 Harry Road, San Jose, CA 95120-6099
V. Lee
Affiliation:
IBM Research Division, Almaden Research Center 650 Harry Road, San Jose, CA 95120-6099
D. Bullock
Affiliation:
IBM Research Division, Almaden Research Center 650 Harry Road, San Jose, CA 95120-6099
R. Karimi
Affiliation:
IBM Research Division, Almaden Research Center 650 Harry Road, San Jose, CA 95120-6099
Get access

Abstract

X-ray diffraction techniques have been used for the structure characterization of Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O thin films. A powder diffraction analysis of Y-Ba-Cu-O films showed that the films deposited at 650°C on Si are polycrystalline and have an orthorhambic structure similar to that of the YBa2Cu3O7 bulk superconductors. In addition to the conventional powder diffraction technique, both the rocking curve and the grazing incidence diffraction methods were used to characterize a YBa2Cu3O7 film on (110) SrTiO3 substrate. Results showed that the film was epitaxially grown and aligned with its substrate in a true epitaxy. Phase identification and line broadening analyses of Tl-Ca-Ba-Cu-O films showed that the films are comprised of one or more superconducting phases and probably contain stacking faults.

Type
VI. Analysis of Thin Films by XRD and XRF
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 269 - 278
Copyright
Copyright © International Centre for Diffraction Data 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Bednorz, J.G. and Müller, K. A.,Z. Phys. B64. 189 (1986).Google Scholar
2 Wuet, M.K. al. , Phys. Rev. Lett. 58 908 (1987).Google Scholar
3 Maeda, H., Tanaka, Y., Fukutami, M., and Asano, T., Jpn. J. Appl. Phys. 27 L209 (1988).Google Scholar
4 Sheng, Z.Z. and Hermann, A.M., Nature 332 138 (1988).Google Scholar
5 Huang, T.C. and Parrish, W., Adv. X-Ray Anal. 22 43 (1979).Google Scholar
6 Segmüller, A., Adv. X-Ray Anal, 29, 353 (1986).Google Scholar
7 Lee, W.Y., Salem, J., Lee, W., Huang, T.C., Savoy, R., Deline, V., and Duran, J., Appl. Phys. Lett. 52 2263 (1988).Google Scholar
8 Bullock, D.C., Lim, G., Salem, J., Lee, W., Savoy, R.J., Hwang, C., Lee, V.Y., IBM Research Report, RJ-591. (1987).Google Scholar
9 Lee, W.Y., Lee, V.Y., Salem, J., Huang, T.C., Savoy, R., Bullock, D.C., and Parkin, S.S.P., Appl. Phys. Lett. 53 329 (1988).Google Scholar
10 Lee, W.Y., Salem, J., Lee, V., Rettner, T., Lim, G., and Savoy, R., and Deline, V., AIP Conf, Proc. 165,95 (1988).Google Scholar
11 Kwo, J., Hsieh, T.C., Fleming, R.M., Hong, M., Liou, S.H., Davision, B.A., and Feldman, L.C., Phys. Rev. B36, 14039 (1987).Google Scholar
12 See, e. g. , Laibowitz, R.B., Koch, R.H., Chaudhari, P., and Gambino, R.J., Phys. Rev. B35, 8821 (1987); Naito, M. et al. , Mater, J.. Res. 2, 713 (1987); and references therein.Google Scholar
13 Powder Diffraction File of the Joint Committee on Powder Diffraction Data (International Centre for Diffraction Data, Swarthmore, PA, 1988).Google Scholar
14 Wong-Ng, W., Roth, R.S., Beech, F., and Davis, K.L., Adv. X-Ray Anal. 31, 359 (1988).Google Scholar
15 Chaudhari, P., Koch, R.H., Laibowitz, R.B., McGuire, T.R., and R. J., Gambino, Phys. Rev, Lett. 58, 2684 (1987).Google Scholar
16 Chaudhari, P., LeGoues, F.K., and Segmüller, A., Science 238, 342 (1987),Google Scholar
17 De, A.M. Santolo, Mandich, M.L., Sunshine, S., Davison, B.A., Fleming, R.M., Marsh, P., and Kometani, T.Y., Appl. Phys. Lett, 52, 1995 (1988).Google Scholar
18 P, S.S.. Parkin, Lee, V.Y., Engler, E.M., Nazzal, A.I., Huang, T.C., Gorman, G., Savoy, R., and Beyers, R., Phys. Rev. Lett. 60, 2539 (1988).Google Scholar
19 Ginlcy, D.S., Kwak, J.K., Hellmer, R.P., Baughman, R.J., Venturini, E.L., and Morosin, B., Appl. Phys. Lett. 53, 406 (1988).Google Scholar
20 Nakao, M., Yuasa, R., Nemoto, M., Kuwahara, H., Mukaida, H., and Mizukani, A., Jpn. J. Appl, Phys. 27, L849 (1988).Google Scholar
21 Huang, T.C., Lee, W.Y., Lee, V.Y., and Karimi, R., Jpn. J. Appl. Phys. 27, L1498 (1988).Google Scholar
22 P, S.S.. Parkin, Lee, V.Y., Nazzal, A.I., Huang, T.C., Gorman, G., and Beyers, R., Phys, Rev. B 38, 6531 (1988).Google Scholar
23 Beyers, R., P, S.S.. Parkin, Lee, V.Y., Nazzal, A.I., Savoy, R., Gorman, G., Huang, T.C., and La Placa, S., Appl. Phys. Lett. 53, 432 (1988).Google Scholar
24 Warren, B.E., X-Ray Diffraction (Addison-Wesley, New York, 1969).Google Scholar