Hostname: page-component-745bb68f8f-kw2vx Total loading time: 0 Render date: 2025-01-27T17:13:06.301Z Has data issue: false hasContentIssue false
  • English
  • Français

Use of a Two-Dimensional, Position Sensitive Detector for Collecting Pole Figures

Published online by Cambridge University Press:  06 March 2019

Kingsley L. Smith  and
Richard B. Ortega
Kingsley L. Smith
Affiliation:
Siemens Analytical X-ray Instruments, Madison, Wisconsin
Richard B. Ortega
Affiliation:
Siemens Analytical X-ray Instruments, Madison, Wisconsin
Get access

Extract

Conventional pole figure instruments consist of a scintillation detector mounted on a 4-circle goniometer operating under computer control. A few instruments make use of a linear PSD detector, which allows collecting data for multiple pole figures sinmltaneously. A PSD does not reduce the required data collection time for the primary pole figure; however, it does save time by eliminating the need to recollect multiple pole figure data. By using a 2D “area” detector, one can simultaneously collect multiple pole figures and reduce the data collection time for the primary pole figure, such an area detector pole figure processing package, GADDS v2, was developed at Siemens and will be discussed.

Type
X. XRD Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 641 - 647
Copyright
Copyright © International Centre for Diffraction Data 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Bunge, H. J., 1982, Texture Analysis in Materials Science: Mathematical Methods, Butterworths, London.Google Scholar
Bunge, H. J., Morris, P. R., and Nauer-Gerhardt, C. U., 1989, “ODF-Analysis of Multipeak Textures”, Textures and Microstructures, Vol 11, pp. 1–22.Google Scholar
Kallend, J. S., Kocks, U. F., Rollet, A. D., and Wenk, H. R., 1991, “Operational Texture Analysis”, Mater. Sci. G Eng., Vol A132, pp. 1–11.Google Scholar
ODF-AT: Texture Analysis Software Package for PC-AT, 1991, SOCABIM, Paris.Google Scholar
Ortega, R. B., and Smith, K. L., 1990, “Integration Methods for Analyzing X-ray and Diffraction Patterns from a Two-Dimensional Position-Sensitive Detector”, 39th Denver Conference poster.Google Scholar