Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-03T01:08:25.679Z Has data issue: false hasContentIssue false
  • English
  • Français

Texture Analysis of Bulk Samples by Neutron Diffraction Using a Position Sensitive Detector

Published online by Cambridge University Press:  06 March 2019

G. Will ,
E. Jansen  and
W. Schäfer
G. Will
Affiliation:
Mineralogical Institute of Bonn University D-5300 Bonn 1, Germany
E. Jansen
Affiliation:
Mineralogical Institute of Bonn University D-5300 Bonn 1, Germany
W. Schäfer
Affiliation:
Mineralogical Institute of Bonn University D-5300 Bonn 1, Germany
Get access

Extract

Texture (of a polycrystalline sample) means the orientation distribution of the many crystallites in the sample with respect to a coordinate system on the sample, for example the rolling direction. Texture is responsible for many macroscopic properties of materials, for example in metals and alloys in the process of rolling or hot-pressing. It carries importance in many everyday production processes. Also in areas of geological science the texture of the sample, e.g. of the rocks should be known in order to explain geological processes.

Type
V. Texture Analysis by XRD
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 285 - 291
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Bunge, H.J., Wenk, H.R., and Pannetier, J., 1982, Neutron Diffraction Texture Analysis Using a 2θ-Position Sensitive Detector, Textures and Microstuctures, 5:153 Google Scholar
Hamilton, W.C., 1964,“Statistics in Physical Science”, New York: Ronald Press Google Scholar
Hers, P., Jansen, E., Schäfer, W., and Will, G., 1990, Profan-PC a PC program for powder peak profile analysis, J.Appl.Cryst., 23:444 Google Scholar
Schäfer, W., Jansen, E., Elf, F., and Will, G., 1984, A Linear Position Sensitive Szintillation Detector for Neutron Powder Diffractometry, J.Appl.Cryst., 17:159 Google Scholar
Will, G., 1989, Crystal Structure Analysis from Powder Diffraction Data, Zeitschr. für Krist., 188:169 Google Scholar
Will, G., Merz, P., Schäfer, W., and Dahms, M., 1990, Application of Position Sensitive Detectors for Neutron Diffraction Texture Analysis of Hematite Ore, Advances in X-Ray Analysis. 33:277 Google Scholar
Will, G., Parrish, W., and Huang, T.C., 1983, Crystal-Structure Refinement by Profile Fitting and Least-Squares Analysis of Powder Diffractometer Data, J. Appl. Cryst., 16:611 Google Scholar