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Study of the Precision of X-ray Stress Analysis

Published online by Cambridge University Press:  06 March 2019

M. R. James  and
J. B. Cohen
M. R. James
Affiliation:
The Technological Institute, Northwestern University Evanst on, 111inois 60201
J. B. Cohen
Affiliation:
The Technological Institute, Northwestern University Evanst on, 111inois 60201
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Abstract

Software is described for complete computer control of residual stress measurements. One program (that incorporates either the two tilt method, the sins| procedure, or the Cohen-Marion technique) has been developed for use with either a normal detector or a position sensitive detector. The operator inputs the desired error in stress and various instrumental parameters that determine systematic errors. The counting strategy to obtain the total error is then determined by the software.

Employing this automated system, an investigation of a parabolic fit to the top of a diffraction profile indicates that a three point fit is satisfactory only for sharp profiles.

Type
X-Ray Diffraction Stress Analysis
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 291 - 307
Copyright
Copyright © International Centre for Diffraction Data 1976

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